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NEWS & REVIEW

1. Editorial
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SUBSCRIBER UPDATE .....777 registered readers

This edition has been edited by our first invited Editor, Don Clark and is dedicated to microscopic vibrational spectroscopy. With much pleasure I hand over to Don...

This edition of IJVS is focused (sorry pun intended) on the use and applications of vibrational microscopy, which is a collective term for FT-IR microscopy, NIR microscopy and Raman microscopy. The feature that links these and a number of other emerging techniques, is that spectral information is obtained via a modified light or atomic force (AFM) microscope. The ability to view a sample before, after, and sometimes even during a spectral data acquisition is very important in the analysis of microscopic samples and areas. In terms of the IR and Raman spectroscopy being performed, these microscope systems offer a convenient method of obtaining a spectrum from a small sample or area. It can be easy to overlook the visual data that is also available. This includes information such as sample size, shape, colour, morphology, crystallinity, and number of phases present. The combination of these physical properties along with the specificity of the spectroscopic data provides a more complete analysis of the sample than by microscopy or spectroscopy alone. To help set the scene, the following pictures show you what a typical FT-IR microscope and a typical Raman microscope look like.

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Nicolet Continum m FT-IR microscope

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Renishaw System 1000 Raman Microscope

I have had an interest in the technique since the mid 1980’s when I purchased one of the first commercially available FT-IR microscopes in the UK. To date, the purchase justification for that instrument was the easiest I’ve ever had to justify to management. The benefits in non-destructive microscopical sample analysis were obvious to all concerned. My perception since then is that for many of the laboratories involved in investigative analysis today, the FT-IR microscope is now a standard technique in the spectroscopist tool box. And in recent years Raman microscopy is becoming more widely used. Having given an external presentation earlier this year on developments in microspectroscopy, I was flattered when Patrick Hendra asked me to get involved # with this microscopy issue. Needless to say I now have an appreciation of the effort which goes into producing each edition of this journal.

# Wrong word - lumbered! - Patrick Hendra

The subjects covered in this edition are the design of FT-IR and Raman microscopes, a personal view on the use and trends in the applications of vibrational microscopy, use of the techniques in combinatorial chemistry and the study of semiconductor materials. It closes with features on FT-IR and Raman chemical imaging, which for me, represents the major application development area in microspectroscopy. The data from these experiments are usually presented in a pictorial manner and provide chemical information about the sample. In very simple terms, these data can be considered as a chemical photograph. The ability to perform routinely non-destructive analysis on solid phase mixtures, (e.g. polymers, biological samples and pharmaceutical products to name but three), and to visually show the location of the components present marks a significant technological advance in vibrational spectroscopy. Through both academic groups and instrument manufacturers, the boundaries of what is possible with microspectroscopy systems is continually being extended. In my opinion this is what makes vibrational microscopy an exciting science to be involved in. My only regret is that these techniques have not made a bigger impact within the microscopy community. Perhaps it’s instrument cost that cause this inertia? However, speaking from experience, I know that when spectroscopists and microscopist share their skills and knowledge there is a significant and positive impact in their studies of microscopical heterogeneous samples and systems.

This IJVS edition presents information on what is currently possible in vibrational microscopy. So what about the future? A consequence of imaging experiments is the vast amount of data they produce. Everybody's experiments will be different, based on sample response, instrument availability, sampling area and spatial resolution. However, one common feature of all these experiments is the vast amount of spectral and image data they produce. I would estimate that most images contain between 1,000 to 25,000 discrete pieces of information. This can equate to file sizes of 40+Mb, so large PCs with hard disc capacity and fast processing speed are essential for handling these large data sets. For many applications the creation of images is relatively easy provided each of the (known) components in the samples has a unique characteristic spectral band. Data analysis becomes more challenging when their are unknowns in the sample, as it is impossible to predict where their unique bands are. Other difficulties arise when the sample components have similar spectra or complex spectra with many overlapping bands. To create meaningful images from these data sets more sophisticated software is required. This software may already exist, but if it does, it is either not readily available or has not yet been applied to these types of problems. (If you know of anything suitable, I’d like to hear from you - don_clark@sandwich.pfizer.com).

At the time of writing, the applications of atomic force microscopes and probes to obtain images with spatial resolutions of below the defraction limit are becoming more widely published. Anecdotally, I have heard of the use of future systems to identify each amino residue in order along a single protein strand. If this becomes reality it will open up many new areas and applications of chemical imaging.

I hope you find this edition interesting, and I’m sure Patrick would like some feedback and any discussion items that arise from the following articles. If you are interested in learning more about the these and emerging microspectrometry techniques I recommend making contact with the following groups/organisations.

Europe 

The Microspectrometry Applications Group ( MAG) - Affiliated to the Association of British Spectroscopists and the Royal Microscopical Society.

The MAG is a UK based discussion group with a goal to promote small sample analysis by spectroscopy through microscopes. It meets twice a year at different locations around the UK as a forum to discuss different areas of applications and new techniques. The group has a triennial award for the best oral presentation at its meeting for young microspectroscopists. To keep all the membership aware of group activities the MAG produces abstracts of all its meetings and appropriate newsletters..

For further details contact Don Clark, Physical Sciences - D265, Pfizer Central Research, Ramsgate Road, Sandwich, Kent, CT2 8EP. Tel. +0044 01304 646036  e-mail: don_ clark@ sandwich.pfizer.com

North America

The Molecular Microscopy Laboratory is based at Miami University, Oxford, Ohio under the direction of André Sommer. This group’s work is dedicated to microspectroscopy research, development and education whilst providing a molecular microscopy service to both scientific and business communities. Each year they run an annual course for any one who wants to learn more about these techniques. The next is in June 1999.

More information can be found at http://www.muohio.edu/~ sommeraj

In addition, the annual Federation of Analytical Chemistry and Spectroscopy Societies (FACSS)conference has sessions covering the FT-IR and Raman microscopy and images. Details on next years conference in Vancouver can be found at http://facss.org/info.html

Don Clark

The views expressed here are personal, and are not those of Pfizer Central Research.

Assistant Editorial
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Just a couple of things - firstly to those readers who have offered to distribute our IJVS cards. It's greatly appreciated and very important to our continued drive to increase our readership. Thank you.

And if there are any more of you who be able to give out some cards, please contact me mailto:louise@ijvs.demon.co.uk or mailto:ijvs@soton.ac.uk .

Secondly, the way we notify readers when each edition is launched has changed slightly and I have been made aware of some errors in a few e-mail addresses that readers have sent us when they have subscribed. This means that when I have tried to notify readers, some messages have been returned as undeliverable. Please make sure that if you wish to receive notification of IJVS that we have the correct e-mail address for you. I would hate to think that there are some readers out there who think that we've forgotten them!

Lastly, we have had a suggestion that we incorporate a site search engine for IJVS. Which means that if you have a certain topic or item that you wish to read up about and we have featured it, instead of wading through all the archives to see if it's there, the search engine will locate it for you. However, it's quite a bit of work involved and we have decided that we won't implement it until after volume 2 is finished.

Louise Martin


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2. Infrared and Raman Microscopes

Bernard Cook

Aire Scientific
52 Wallerscote Rd.,
Weaverham,
Northwich CW8 3LY
UK.
Tel/fax ++(0) 1606 852298

 

Introduction
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Infrared and Raman microscopies FTIR- microscopy and Raman- microscopy are hyphenated techniques i.e. both of the parts provide information of equal importance to the final result. Let us look at the parts separately and then the combinations and then the similarities.

Microscopes
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A microscope is a precise optical instrument . It has been developed over centuries in order to reveal the small, and fractions of larger samples that are beyond the normal sight. The microscope allows a sample to be held in a stable manner without vibration so that small areas of a sample may be illuminated and seen at high magnification without distortion. Many years of research and development has resulted in lenses that are aberration free, these produce an image that is in focus across the full field of view. They are used on an infinite variety of samples, some are transparent and some are opaque.

The microscope is used to characterise and identify many samples on its own, and for this a number of different illumination methods are used. It is not sufficient to just shine a white light onto or through the sample to reveal all of the components of the sample, many details can only be revealed if the appropriate illumination method is used from the following:- bright field, dark field, polarised, phase contrast and fluorescence. If you do not reveal all of the components then when you try to identify what you see you can only be partially successful.

The ability to reveal components of a sample is also governed by the methods of sample preparation and how the sample is presented and the magnification used.

A microscope usually has a number of lenses mounted on a turret that have different magnifying powers. These lenses should be parfocal. This means that once one of the objectives in the nosepiece set has been focused on the specimen, all of the other lenses may be used and the focus will be approximately correct for each. In addition the lenses should be co-linear. This enables you to move the lens and select higher magnifications without varying the centre point of the examination.

The hyphenated techniques and their widespread use is a result of the development of more sensitive detectors for both infrared and Raman spectroscopies.

FTIR - microscopy
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FTIR is a technique that enables us to identify compounds from their infrared absorption spectrum. Microscopy is a method of sample handling that is suitable for infrared examination . In order to combine these two methods a number of criteria need to be met .

  • The infrared light path should match the white light paths when it travels through the sample. This way you know that the area seen is the same area through which the infrared passes.
  • A selection of IR cassegrainian lenses should be available if a wide variety of samples are to be successfully examined. These include variable magnifications e.g. 15x 36x 52x and an ATR lens.
  • There should be a method of selecting the region from which the IR spectrum is required, this is the apertures. Without an aperture or mask, the signal seen by the detector is usually from the whole field of view. The aperture is essential for obtaining spectral data from specific regions that are smaller than and within the field of view.

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    Figure 1. Infrared Microscope Schematic

  • The aperture should be located at the first magnified image plane of the objective lens. At this point the image is magnified and the aperture which is used to mask the image will be much larger than the sample that is being examined. The long wavelengths used in the infrared have passed through the sample, and the larger aperture will contribute little to any diffusion anomalies, so the full spectrum to 650cm-1 is seen on a flat background from 2 - 3um samples.
  • The objective and condenser lenses should be cassegrain mirror lenses, with closely matched numerical apertures. Glass does not transmit sufficient IR light.
  • The sample and apertures should be in focus when viewed through the eyepieces or on the CCTV
  • The detector should be a cooled MCT detector.
  • An image showing the distribution of a particular IR frequency may be produced by having a motorised stepping stage (mapping stage) on the microscope. This is used to move the sample in fixed steps over an area of the sample.

A small aperture that allows sufficient energy to pass to give a reasonable spectrum is selected. This is moved in a regular manner pausing after each step in the horizontal direction to collect a spectrum. At the end of each row the stage moves rapidly back to the start of the next row in the directions shown. After all of the data has been collected an absorption band is selected that is characteristic of one portion and by plotting the absorbance value against step distance a map of the distribution may be obtained.

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Figure 2. Schematic of mapping



Raman - microscopy
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  • Raman microscopy is in all ways complimentary to its infrared analogue. The principles however for the microscope illumination remains the same, (see microscopes)
  • Raman microscopy is however limited by only using the overhead pathways for the Raman laser path. This means that the Raman signal is obtained only in the back scatter mode.
  • The laser should travel along the same light path as the visible reflected light used to illuminate the sample.
  • Apertures to separate portions of the sample are not necessary as the laser is a point probe when it has passed through the objective lens. Raman emissions are produced from this focused spot.
  • The Raman emissions need to be separated from the Rayleigh emissions from the sample by either filters (the modern way)or a good spectrometer i.e. double or triple monochromators. The selection of separation depends on the spectrometer of choice for doing the Raman spectroscopy.
  • For FT Raman, filters are almost exclusively used to select the Raman light.
  • The laser focus and the white light focus should be co incident. Therefore as the laser is parallel light infinity corrected optics in the microscope work the best.
  • If the laser is sufficiently powerful, and a CCD detector is used then by defocusing the laser an area may be illuminated. If a separation of the Raman light is now performed then by accumulating the signal an image in Raman light can be produced. This is a Raman map. For FT and other Raman spectrometer systems a mapping stage performs a similar task to that in the infrared microscope system.

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Figure 3.  Raman Microscope Schematic

A: Optical filter
laser line reflector
longer wavelength transmitter
B: Fixed Mirrors
C: Moveable Mirror

  • Raman microscopy is in the main a confocal technique. Emission from a spot source that is focused through an entrance slit in a monochromator means that the spectral data is only collected from the point where the laser is focused. This need not be on the surface, e.g.. samples in glass containers. Depth profiling through a layered sample that does not scatter the laser is possible in Raman microscopy. Spectra of each layer may be obtained without the need to physically separate them. Infrared microscopy, is an absorption technique, and is sensitive to the full light path but at a restricted aperture. Depth profiling is not possible only 2 dimensional separations can be made in infrared microscopy.
  • Glass lenses are suitable for Raman microscopy, however some have spurious lines that arise from the coatings used in their construction.

An example of a full research microscope that has all of the microscope techniques available and will interface to Raman and/or any FTIR spectrometers with external beam facilities, the AIRE ENT IR 800R, is shown below.

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Figure 4. AIRE ENT-IR 800R Microscope

Conclusion
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These hyphenated techniques are excellent ways of doing most solid and liquid samples. Raman microscopy is probably the quickest way of examining most samples as there is no sample preparation and you know that when the laser spot is in focus that you will have the best Raman signal. Fluorescence is not as damaging in preventing you from seeing the spectrum in Raman microscopy as it is in conventional 90° collections. This is due mainly to the smaller focal volume of the laser focus burning out the fluorescence more quickly than is possible in 90° work.   The CCD detectors and computer techniques help enormously in improving the use of Raman spectroscopy.

Infrared spectroscopy has always required sample preparation, and infrared microscopy is no exception. Good sample preparation and the correct use of the microscope greatly improves the quality of the information that you may obtain from the technique. The more you use the microscope the more familiar you will become with the controls. Problem solving will be easier if you can combine the information you gather from microscopy with the spectroscopic results. Microscopy when used in a combined technique with a spectroscopy gives an added value to the analytical results that is not possible when they are used separately.


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3. Vibrational Microscopy:
A Personal Guide to Techniques and Applications.

Don Clark

Physical Sciences,
Pfizer Central Research,
Ramsgate Road,
Sandwich, Kent,
CT2 8EP,
UK

Introduction
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The term vibrational microscopy is one that is becoming more frequently used to describe collectively the techniques of FT-IR microscopy, NIR microscopy and Raman microscopy. All allow vibrational spectra (i.e. IR or Raman) to be obtained from small samples via adapted light microscopes. This paper is an introduction to the practical aspects of vibrational microscopy, the types of experiments that are currently possible, and some interesting applications of these versatile methods. For more information, reviews,[1, 2, 3] reference books,[4, 5] and other journals should be consulted. It should be pointed out that the nomenclature used to describe these techniques is not globally consistent. European publications tend to use the terms FT-IR microscopy and Raman microscopy. This is consistent with the nomenclature used by the Royal Microscopical Society (e.g. Light microscopy, Scanning electron microscopy etc.). American publications use the terms IR microspectroscopy and Raman microspectroscopy. The term microspectroscopy is also appropriate for microsampling techniques which include beam condensers, diamond anvil cells, and the new generation of single reflection ATR accessories, as well as being used to describe microscope based systems. My personal belief is that the European nomenclature is scientifically specific and correct. However, with the dominance of the US publications and market forces it is unlikely that there will be a unification of terminology in the foreseeable future.

Historically, it was the Raman microprobe [6] which first made an impact on small sample analysis. However, this type of system was typically only found in multi-national companies and a few academic institutions. The applications afforded by FT-IR microscopy, and introduced to the scientific community in the early 1980’s, proved to be much more applicable and accessible to many more analytical laboratories. Raman microscopy is currently going through a renaissance due to the emergence of bench top systems using CCD (charge coupled device) detectors and notch filters (rather than double or triple monochromators) for laser rejection. NIR microscopy is an emerging technique which has effectively extended the spectral range of the FT-IR microscope into the near IR region. Its applications have yet to be established. It should be stressed that vibrational microscopy is only one of a number of spectroscopic and microscopical tools the analyst can call on to solve problems. There are many forms of microscopy that can give information on the chemical composition and/or sample structure. Many of these techniques are included in a review paper by Peter Cooke on chemical microscopy and this is a good reference point for identifying modern microscopy techniques and their applications.

The bulk of this article concentrates on how to carry out vibrational spectroscopy and its current applications. With the wide scope of information, it has been divided into the following sections.

Practical aspects of vibrational microscopy

i. Sample preparation for FT-IR microscopy
ii. Sample preparation for Raman microscopy

Recent applications and technological advances

i. Instrumentation and techniques
ii. Areas of Application

Practical aspects of vibrational microscopy
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When or how should an FT-IR or Raman microscope be used ? This question will have a wide variety of answers depending on what information is required. Vibrational microscopy is used in its most simple form as an expensive beam condenser coupled with a high performance viewing system. This allows the analyst to survey the sample and position the area of interest in the IR or laser beam. At the other extreme it may be used to determine the number and physical shape and size of the different phases present. By observing samples under white light and through crossed (plane) polarisers, areas of birefringence will be observed enabling identification of crystalline materials to be made. If the system is fitted with photomicrography or image capture equipment, a permanent white light image of the sample can be obtained.

With respect to size, transmission FT-IR microscopy measurements can be made on samples having XY dimensions of ca. 10-250 m m with a thickness of <30 m m. Typically samples have dimensions of several 10’s of microns. Recent developments using synchrotron sources enable sub 10 m m samples to be studied [8]. Raman microscopy systems allow significantly smaller samples to be studied routinely. Depending on whether a dispersive or FT instrument is used the sample size is typically 1-30 m m.

Before performing any vibrational microscopy, I would recommend observing the sample using a low power stereomicroscope. This has two benefits. Firstly, it allows the whole sample to be surveyed quickly, and as these microscopes are binocular instruments, a full perception of sample depth is provided. This simple sample observation may give many clues as to the samples identity, or to what has happened to the sample prior to analysis. From my own experience dark coloured features that appear to be on the surface of a sample when viewed by the naked eye, may in fact be close to the surface, but covered by clear or less coloured matrix. Secondly, if required, the stereomicroscope can be used as an aid in microsampling preparation. Its low power magnification (10-60X) and large working distance* make, for example, the extraction of a specific particle or fibre from a solid or liquid matrix with a fine needle considerably easier than performing the same operation whilst viewing the sample by the naked eye alone.

(* working distance = distance between objective lens and sample stage)

i. Sample preparation for FT-IR microscopy
Where possible, I prefer to obtain spectra in transmission mode as these tend to produce significantly better spectra than those made in reflection mode. This generally requires some form of sample preparation to maximise the sample area and minimise its depth. ( My general rule of thumb is that if the particle can be observed by the naked eye it is too big to be used "as is" for transmission FT-IR microscopy work). The sample will often require some form of pressing, squashing or rolling before it is transferred to an optically clear window material suitable for FT-IR microscopy (e.g. NaCl, BaF2 etc.). An elegant and effective preparation method is to press the sample between two diamond windows. This method offers three advantages which are:

1. the sample is contained by the device avoiding accidental sample loss during flattening.

2. the procedure can be observed under a stereomicroscope. Pressure is only applied until the sample forms a glass and flows to form an appropriately thin sample.

3. the diamond can be used as the window material, thus removing the need to place the prepared sample on another substrate prior to FT-IR microscopy.

In some cases the sample will have to be studied without preparation. This may be because the sample could change during preparation (e.g. undergo a polymorphic transformation), or is required in its intact state for further testing or archiving. Where these samples are too thick or opaque for transmission measurements, the objective Cassegrainian lens can be used in reflectance mode. It can be considered to be a micro diffuse reflectance accessory; one half of the lens delivering the IR beam to the sample and the other half collecting the resulting reflected energy. This (transflection) approach provides ca. 50% of the incident energy available in transmission experiments, so in practical terms reflectance measurements require extended acquisition times in order to obtain the same quality spectra that are obtained in transmission mode.

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Figure 1. ATR-FTIR microscopy in action

There are two other approaches to reflectance FT-IR microscopy. These are through the use of attenuated total reflectance (ATR) - See Figure 1, and grazing angle objectives. ATR FT-IR microscopy uses the same principles as traditional ATR methods and allows spectra of microscopic areas to be obtained through direct contact with the ATR objective - See Figure 2. This method is so easy to use it can also be used to obtain information from sample surfaces that would normally be obtained using macro ATR accessories. (N.B. this approach has been modified in the design of the latest single reflection ATR units that are proving extremely useful in providing rapid analysis of bulk solids, liquids, and pastes). Grazing angle accessories have been used for many years to study thin coatings on substrates, and thin film lubricants. The availability of grazing angle objectives means that these types of studies can now be performed routinely at a microscopic scale.

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Figure 2. ATR-FTIR microscopy sample in contact with ATR objective

Another approach to obtaining spectral information from thick or opaque samples is to use NIR microscopy. NIR bands originate from overtone and combination bands of IR fundamental bands and as a consequence are significantly weaker than those in the mid IR region. This is advantageous in NIR microscopy as much thicker samples
(>1000 m m ) can be studied without exceeding the dynamic range of the detector. This also means that minimal sample preparation is required prior to performing NIR microscopy. This approach was first suggested [9]in the late 1980’s, but has only recently become a commercial reality.

ii. Sample preparation for Raman microscopy
Raman spectroscopy is a complementary technique to IR spectroscopy in terms of the spectral information each provide. In vibrational microscopy there is also a complementary nature to sample analysis. In the Raman experiment, the Raman shifted wavelength are backscattered 180° to the incident laser radiation. For this reason virtually no sample preparation is required for many samples. Sample thickness and opaqueness for Raman measurements are irrelevant, and those samples which are difficult to study by FT-IR microscopy pose few problems for the Raman microscope. Similarly, samples containing water or in contact with glass can be measured directly by Raman microscopy. Generally all that is required is that the working distance of the microscope can accommodate the sample.

The major problem associated with any Raman measurement, including microscopy methods, is sample fluorescence. Fluorescence can often be avoided by using FT-Raman systems using 1064 or ca.780 nm lasers to irradiate the sample. Unfortunately, sensitivity at these wavelengths is poor. Sensitivity is improved by using an excitation wavelength of 633 or 514 nm, but here fluorescence may be the dominant spectral feature. A new approach to avoiding fluorescence is to use a deep UV laser, but by this method the sample may be damaged due to the much higher energy of this excitation source. In my experience, a suitable laser wavelength with which to obtain Raman spectra can be found for the majority of samples submitted for analysis.

Recent applications and technological advances
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i. Instrumentation and techniques
The most current and significant area of growth in vibrational microscopy is chemical mapping and imaging. Although the concept is not new, the instrumentation required to provide reliable IR or Raman chemical images has only become available over the last few years. This technology now allows multi-component systems to be mapped, and the location, shape and size, of each material present to be visualised through the chemical images that are produced. These images are based on spectral features that are unique to each of the materials present and provide a valuable source of chemical information that has previously been unattainable. Specific instrumentation and applications are detailed elsewhere in this journal [10, 11] and other review articles.[4, 12] All these mapping/imaging techniques produce chemical images with a spatial resolutions of ca. 1-20 m m. A development of SNOM (Scanning Near-field Optical Microscopy) has reduced this spatial resolution below the diffraction limit and provides a spatial resolution of between 20 and 150 nm from which Raman spectra can be obtained. [13, 14] The technique can be described, in very simple terms, as the linking of the atomic force microscope (AFM) to a spectrometer via a fibre optic. SNOM is an emerging technique and has many novel applications including the study of receptor / ligand binding in biological systems, thin films (e.g. Langmuir-Blodgett monolayers), and stress measurement in silicon. The technique of photothermal FT-IR spectroscopy has recently been announced which allows discrete thermal and IR data to be obtained at a similar sub micron spatial resolution.

Several classical light microscopy techniques have been successfully adapted for use in vibrational microscopy. A technique which is becoming increasingly more used is confocal Raman microscopy. This exploits a feature found in some optical microscopes. Using an aperture at one of the microscopes focal planes, it is possible to study non-invasively a layer within a sample rather than just at its surface. This allows a sample to be depth profiled, and if a XY stage is available, provides an opportunity to image a sample volume rather than just a surface.

Crystallinity and molecular orientations in individual particles and fibres can be probed by using polarised FT-IR microscopy. Here an infrared polariser is placed in the IR beam and spectra acquired from the sample placed alternatively perpendicular and parallel to the polarised beam. Differences in the spectra can be used to determine specific orientations and interactions of functional groups within the sample. In the case of fibres, dichroic ratios (Iparallel/Iperpendicular) can be used in the non-destructive prediction of their physical properties [4].

FT-IR and Raman thermomicroscopy use a heated / cooled stage to enable samples to be studied at non-ambient temperatures. The main applications of vibrational thermomicroscopy are to study spectroscopically (and visually, though not necessarily mutual) the changes in polymorphism and crystallinity of single sample particles/crystals. In these experiments the transformation from one form or phase to another is temperature dependent. Another approach is to use a modified differential scanning calorimeter to heat and cool the sample. This combination of techniques allows structural information to be correlated to the thermogram obtained from the same sample.

ii. Areas of Application
The ability to perform non-destructive or non-invasive analysis on small and often unique samples by vibrational microscopy has been utilised successfully by forensic scientists. There are many examples in the public domain of how these techniques have been used to identify microscopic particles, crystals, paint chips, and fibres associated with accidents, incidents, and criminal activity. Constant improvements in instrumentation now allow not only fibres identities to be determined, but also the dye types used to colour them [15]. This is potentially very beneficial in understanding and dating historical samples. Similarly, Raman microscopy is being used in art conservation [16] to determine which pigments are deteriorating and those which have been added to the piece at a later date. This thinking can be extended to identifying forgeries, by comparing the date of the painting with those of the pigment introductions to the art world. Any anomalies between dates would suggest the history and/or origin of the painting should be investigated.

An exciting application has used Raman imaging techniques to study fingerprints for traces of explosives such as TNT and Semtex. [17] The imaging identifies which components are present, and by making confocal measurements an estimate of the amount of each compound present across the image can be made.

Vibrational microscopy has many applications in biomedical studies (extensively reviewed by Victor Kalinsky [18]), including an often quoted example of the imaging and identification of silicone in breast tissue biopsies following the failure of implants. FT-IR can be used to differentiate between the a -helix and b -sheet secondary structures in proteins. This has been used successfully to show that the anticancer drug adamantyl maleimide ( AMI) produces a conformational change in both the membrane and intracellular proteins of the human gastric carcinoma cell line SC-M1 [19]. This gross change in secondary structure has been linked to the cell viability, and can be used to monitor the effect of different drug concentrations on the carcinoma.

Principle component analysis and reflectance FT-IR microscopy data has been used to differentiate between the properties of bacterial colonies [20]. By observing the frequency of the asymmetric phosphate band, it was possible to determine which colonies were Gram positive and which were Gram negative. The advantage of this technique is that it is non destructive, requires no sample preparation, and is better at discriminating between bacteria types than other spectroscopic methods. The use of synchrotron sources has allowed IR spectra to be obtained from single living cells [21]. With spatial resolution of a few microns now possible, the distribution of functional groups of proteins, lipids and nucleic acids in a cell have been mapped. In addition, the changes in lipid and protein distributions during cell division and necrosis have been determined using this method.

Within the pharmaceutical industry, vibrational microscopy has a special role in the analysis of samples in their solid state. This is important as the polymorphic form of the drug and/or excipients is often vital to the performance of the product. For example [22], a capsule formulation of SCH 48461 showed a slowing of dissolution with respect to time. Using ATR FT-IR microscopy this was shown to be due to a conversion in the formulation of the drug from an amorphous state to crystalline form; the latter having a lower solubility in the water. Similarly, Raman chemical imaging has been used to determine the size, form, and distribution of the drug and excipients in tablet formulations. Figure 1 shows the chemical images from two batches of a tablet formulation which have good and poor dissolution profiles. These images show that the particle size and distribution of the drug and excipient A are different in the two batches. With this information it has been possible to optimise formulation manufacture to produce tablets with good dissolution properties [23].

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Figure 3. Raman chemical images from tablets having different Dissolution profiles.
Scale: each pixel is 5 x 5 µm.
KEY: Red = Drug; Blue = Excipient A; Green = Excipient B

Another advantage of chemical imaging is that it can be applied to complex multiphase systems, which by light microscopy are of inherently low contrast. Emulsions are good examples of such systems, and Raman imaging offers a unique method for identifying the components present in aqueous, droplet and structural phases present in these formulations [24]. A review of this type would be incomplete without a few recent examples from the polymer industry. A paper by John Chalmers and colleagues [25] demonstrates the applications of several of the techniques in the characterisation of industrial materials. The use of a synchrotron as a light source now allows the IR spectra of sub 10 micron thick samples to be obtained, which has applications in studying thin layers in polymer laminates. One example demonstrates how IR imaging shows not only the location of known polymeric material in a sample, but also locates and allows identification of contaminants which were invisible by light microscopy. Imaging is not confined to static systems. Time domain FT-IR microscopy utilising a focal plane array ( FPA) detector has allowed the observation of low molecular weight liquid crystals diffusion into poly( butylmethacrylate) film in real time [26].

The performance of a polymer is dependant on a number of factors, a number of which can be probed at the microscopically level by vibrational microscopy. FT-IR microscopy in conjunction with scanning electron microscopy (SEM) and light microscopy, has been used to assess the crystallinity and molecular orientation and by implication, the performance of nylon 6,6 vibrational welds [27]. There are many examples of the Raman spectroscopy/microscopy to determine the stress/strain present in a sample. A recent example demonstrates how this microscopical method can be used to measure these properties at localised spots in polymer based composites [28].

Mention of other applications should be made which include quality and microstructure measurements of CVD (chemical vapour deposition) diamond films used as coating for computer hard discs, analysis of combinatorial chemistry products whilst attached to their solid phase substrates, and the investigative analysis of unknown fibres, particles, crystals and contaminants.

Although, not an exhaustive review of vibrational microscopy applications, this article has given an overview of the type of studies that can be tackled using FT-IR and Raman microscopies. The continued development of new instrumentation and on-going research projects clearly demonstrates that vibrational microscopy has established itself as a valuable tool in solving microscopical problems in analytical laboratories around the world.

References
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  1. Katon J.E., Micron, 1996, 27(5), 303-3182
  2. Clark D.A., Encyclopedia of Anal. Science., Academic Press, 1995, 3174 - 3182.
  3. Treado P.J. and Morris M.D.,Appl. Spectrosc. Rev., 1994, 29(1), 1-38
  4. Infrared Microspectroscopy Theory and Applications; ed. Messerschmidt R.G. and Hartcock M.A.; Marcel Deker Inc. New York, 1988.
  5. Practical Guide to Infrared Microspectroscopy; ed.Humecki H.J.; Marcel Dekker Inc. New York; 1995
  6. Delhaye, M. and Dhamelicourt, P.J.; J. Raman Spectrosc.; 1975, (3), 33-43
  7. Cooke, P.M.; Anal. Chem., 1998,70(2) 385R-423R
  8. Reffner J.A.,Carr, G.L, Williams, G.P., Mikrochim.Acta, Suppl., 1997, 14(Progress in Fourier Transform Spectroscopy), 339-341
  9. Smith M.J., Appl. Spectrosc., 1989, 43(5), 865-873
  10. Treado P.J.; IJVS in press
  11. Wright N..,IJVS in press
  12. Lewis E.N., Levin I.W., J.Microsc.Soc.Am., 1995, 1(1), 35-46.
  13. Webster S., Batchelder D.N., Smith D.A.; Appl. Phys. Lett.; 1998,72(12) 1478-1480.
  14. Pohl D.W et al.; Chimia 1997, 51(10), 760-767.
  15. Grieve M.C., Griffin R.M.E.; Malone R.; Sci. Justice 1988, 38(1), 27-37.
  16. Clark R.J.H., Gibbs P.J.; Anal. Chem. 1988, 70(3), 99A-104.
  17. Mercado A.G.; Janni J.; and Gilbert B.; Proc. SPIE-Int. Soc. Opt. Eng.; 1995, 2511, 142-152
  18. Kalinsky, V.F.; Appl. Spectrosc. Rev.;1996, 31 ( 3) , 193-249.
  19. Wang, J-J; Chi, ,C-W; Lin, S-Y; Chern Y-T; Anticancer Res.; 1998 17 ( 5A) , 3473-3477.
  20. Lang, P.L. and Sang, S-C.; Cell. Mol.Biol.; 1998, 44 ( 1) , 231-238.
  21. Jamin, N. et al.; Proc. Natl. Acad. Sci. USA.; 1998, 95 ( 9) , 4837-4840.
  22. Markovich, R.J. etal.; J. Pharm. Biomed. Anal.; 1997, 16 ( 4) , 661-673.
  23. Clark, D.A. and Staps, D.J.; Proc. 3rd Aust. Conf. Vibrational Spectrosc., 1998, 31-33.
  24. Andrew, J.J. et al.; Appl. Spectrosc.;1998, 52 ( 6) ,790- 796.
  25. Chalmers, J.M. et al.; Analyst; 1998, 123 ( 4) ,579-586.
  26. Snively, C.M. and Koenig, J.L.; Macromolecules; 1998, 31 ( 11) , 3753-3755.
  27. Stevens, S. M.; Annu.Tech.Conf. - Soc. Plast. Eng.; 1997, 55 ( 1) , 1228-1232.
  28. Arjyal,B., Paipetis, A., Galiotis, C.; Nondestr.Test. Eval.;1996, 12( 6) , 355-366.

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4. FT-IR Analysis of Combinatorial
Beads and Crowns

Robert Alexander

Perkin Elmer Ltd
Post Office Lane
Beaconsfield
Bucks HP9 1QA
UK

Introduction
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Combinatorial Chemistry has become a very popular technique in the armoury of the synthetic chemist, particularly in the pharmaceutical industry. A major part of this Chemistry is the use of solid phase chemical reactions (syntheses) which take part on the surface of specially designed polymer which are mainly in the form of beads or crowns (pins).

This application note will give a brief overview of the Combinatorial Technique and outline how FT-IR spectroscopy can be used to monitor these synthetic sequences and also consider the relative merits of various sampling methods available for this type of analysis.

Why use Combinatorial Chemistry?
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Traditionally, drug discoverers have looked to natural product extracts or existing company libraries of compounds as a source of such materials. Unfortunately, many of these libraries can lack structural diversity and finding active products from natural sources can be difficult and very time consuming. This has lead to a change in emphasis away from a structured, rational approach to new compound discovery to a more empirical approach where the emphasis is on the synthesis of a very large numbers of new structures and using the rapid screening methods now available to test for activity within these groups. Once activity has been established a more step-wise approach to the synthesis is employed to isolate the active structure.

What is Combinatorial Chemistry?
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Combinatorial Chemistry is the synthesis of a large number of different molecules in a quick and convenient manner. The starting substrate(s) is linked to a solid support material and subsequent chemical modifications to the molecules take place on the solid surface. At the end of the reaction sequence the final products are cleaved from the solid support using an appropriate chemical reaction. The difference between a conventional synthesis and a Combinatorial synthesis is shown in Figure.1.

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Figure 1.

The advantages of this type of synthesis are that the many different products exist as easily separable "packages" (as opposed to a homogeneous solution) and that purification between stages in the synthesis is minimal. The ease with which large numbers of different products can be separated and re-reacted lends itself to automation of the total synthetic sequence.

The Solid Support materials are normally polymers that are designed to be inert and have a large surface area. These are commonly in the form of beads (50-100 microns) or crowns (pins) although other forms are being developed. The earliest form of resin was the Merrifield Resin (Figure 2), based on polystyrene beads derivatised with chloromethyl groups and used in peptide synthesis.

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Figure 2. The Merrifield resin

Other polymers are used in order to generate differing reaction environments; polystyrene giving a hydrophobic environment whereas a polyamide would generate a hydrophilic environment. Tentagel, which is 80% polyethylene glycol grafted to polystyrene has become increasingly popular since it is believed to generate a more "ether-like" environment which lends itself to a greater range of chemical reactions and hence a greater range of possible structures.

The Linker Groups are the chemical groups that link the substrate to the polymer resin. Since it is this group that that must be broken at the end of the chemical sequence, their structure determines the method of cleavage from the resin. It is important that this cleavage reaction does not destroy the new products that the chemist has synthesised.

The real importance, however, of these Linker groups is that they determine the terminal functionality of the product ; thus, by using the same Linker group for an entire chemical library all the resultant products will have the same end group functionality.

Examples of these Linker groups are Wang Resin Linkers (Figure 3) which can be used in the synthesis of carboxylic acids.

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Figure 3.Wang resin linkers

Other Linker groups include Rink Amide Linker (Figure 4) for primary amide synthesis and REM (Figure 5), HMB and Oxime Resins (Figure 6) which are for tertiary amine, C-terminally amidated peptide, and alkylamide synthesis respectively.

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Figure 4. Rink Amide Linker

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Figure 5. REM

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 Figure 6. HMB and Oxime resins

There have been several different techniques used in COMBINATORIAL SYNTHESIS to generate large libraries of new structures quickly and efficiently. One such method is described as "Mix and Split" (Figure 7) and was developed by Furka. This is where, for example, three initial materials X,Y, and Z are bound to a resin and mixed together. The resultant mixture is split into three separate reaction vessels and each is coupled with a further set on reagents. Dimer samples from each of the three reaction vessels are saved for subsequent reactions. The remainder of the dimers are mixed, split and put into three separate reaction vessels again. These dimers are reacted again with a further set of reagents resulting in twenty-seven different structures being formed, nine in each of the three vessels.

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Figure 7.

At this stage each of the three reaction vessels are tested for activity (Figure 8). On the basis that one of the vessels shows activity this limits the active structure to be one of nine.[This description is simplistic because the yield is likely to be less than 100% and impurities and bi-products may be generated tending to confuse the process involved.]

In the example given it is clear that the active structure must have Y as its terminal group. At this stage the retained dimer structures are reacted only with reagent Y to give nine final products, three in each of the reaction vessels. A further activity test reveals which of these vessels contains the active structure and each of the three compounds in this vessel can be synthesised independently 

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Figure 8.

Analysis of combinatorial intermediate
and final products
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Product analysis can be carried out by cleaving the product from the resin and carrying out a normal classical chemical analysis by some form of spectroscopy. The chemist, however, would like some means of determining the success of his reactions whilst the substrate is still attached to the resin. This would allow him to proceed with the next stage in the sequence without the inconvenience of the cleavage step. For single products this is normally done using IR or NMR whilst for multi-component mixtures HPLC-MS is becoming the method of choice. The remainder of this note will consider the advantages and disadvantages of FT-IR (and Raman) spectroscopy as an analytical technique and also compare the various IR sampling techniques.

It is worth noting at this point that in most cases the synthetic chemist wants to follow a reaction sequence rather than obtain a definitive chemical structure. This means that the monitoring by IR of the appearance or disappearance of specific functional groups is the required objective. This is fortuitous since the resultant IR spectrum from the resin-substrate combination, although dominated by the contribution of the resin, does indicate the presence of the required substrate functionality. It is also worth noting that it is preferable for the analysis to be carried out in the same laboratory as the synthesis and by a non-specialist and therefore the analysis should be as straight forward as possible. Once again it is fortuitous that most synthetic chemists are used to following reaction sequences by following the progress of various functional groups by IR spectroscopy.

The sampling techniques studied were:

  1. KBr discs
  2. Diffuse reflectance on aluminised reflective pads.
  3. Single-reflection (diamond) ATR
  4. Microscopy …..both normal reflectance and micro-ATR
  5. Raman spectroscopy
  6. Transmission through flattened bead

Although photo-acoustic spectroscopy has been used by other investigators, it has not been considered here since the technique requires some degree of expertise to be fully successful.

Results for Bead Samples
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Figure 9 shows the spectra obtained from a Wang resin bead with substrate attached. The three spectra were obtained using Diffuse reflectance (Spectrum 1), Single Reflection Diamond ATR (Spectrum 2), and Reflectance Microscopy (Spectrum 3).

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Figure 9. Spectra from Sample 1 run using different techniques

Although the spectra are dominated by contributions from the polystyrene Wang resin, the important functional group in this synthesis was the carbonyl group whose absorption band is clearly shown at about 1770cm in all three spectra. The same bead sample was analysed by micro-ATR on the IR microscope and Figure 10 compares the normal reflectance spectrum (Spectrum 6) with that using the ATR objective (Spectrum 7).

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Figure 10. Spectra from Sample 1 run using IR Microscope

A similar set of spectra was run for a second substrate on a Wang Resin. The diffuse reflectance (Spectrum 4), single reflection diamond ATR (Spectrum 5), and reflectance microscopy (Spectrum 6) spectra are shown in Figure 11.

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Figure 11. Spectra from Sample 2 run using different techniques

Similarly, the beads were run using micro-ATR (Spectrum9) and normal reflectance (Spectrum 10) on the IR microscope (Figure 12).

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Figure 12. Spectra from Sample 2 run using IR Microscope
[Beads are appoximately 70 micro-metres in diameter]

In this particular example the detection of the hydroxyl group (absorption band at ~3300cm) is paramount in the structure identification. It is clear from the above data that this it is extremely difficult to detect this band using single reflection ATR methods either on the Diamond ATR accessory or on the microscope. This may be because these techniques sample such a small area of the sample and hence small amount of sample or it could be due to the wavelength dependence of such ATR techniques; absorption bands at higher wavenumbers do appear less intense than lower wavenumber absorptions. In an attempt to eliminate this later effect an ATR correction was carried out on one of the above ATR spectra and the results are shown in Figure 13.

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Figure 13. Effect of ATR Correction on Micro ATR results

The top spectrum shows the original data and the bottom shows the result of the ATR correction. Although the hydroxyl absorption band is slightly more distinct it is still a weak feature and could be overlooked. Also the fact that such post-run manipulation is required would tend to compromise the ease-of-use criteria.

Although the KBr disc method of preparing samples can be considered as difficult and time-consuming, it can produce completely satisfactory spectral results. Figure 14 shows the KBr spectra for both the Wang beads analysed above and show all the relevant features required by the chemist.

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Figure 14.

Since it is clear that transmission mode spectra do show the required features without being totally masked by the contribution of the polymer resin, an alternative to KBr disc making was sought. One such option is to use a Diamond Anvil Cell to crush a few beads between the diamond windows and run this directly on the IR microscope (Figure 15).

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Figure 15. Results for Wang Beads in
Diamond Cell in Microscope

The quality of this data is very good, the top spectrum showing clearly a strong carbonyl absorption band and the lower showing the hydroxyl grouping.

To determine if similar data could be obtained from other types of beads, the same techniques were used to obtain spectra from a substrate on a Tentagel bead. Figure 16 shows the micro-ATR (top), single reflection diamond ATR (middle), and diffuse reflectance spectra from such a material.

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Figure 16. Comparison of Sampling Methods for "Tentagel" Bead 1

Once again in this example the detection of the hydroxyl group at ~3300cm is important. As with the Wang resin, the diffuse reflectance spectrum shows this absorption clearly whereas in the ATR data this feature is barely detectable.

Results for Crowns (Pins)
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These Crowns come in a variety of shapes and sizes with the most common shape being shown in Figure 17. They are normally about 3 to 4 cm in length. The initial starting material is bound to the surface of the polymer Crown. In use they are suspended from a tray into a reaction vessel into which differing reacting substrates are found in solution. Between each step in the synthesis the tray is raised from the reaction medium and the Crowns washed with an appropriate solvent.

The IR analysis of these Crowns does present additional difficulties over that for the beads. The shape and their structure rules out performing straight transmission measurements on them and since the surface of one Crown may contain the total yield of the synthesised material the chemist is particularly concerned not to destroy or damage the surface; he will require the Crown for the next stage in the reaction. These criteria tend to rule out the use of Diamond ATR accessories which would require that the Crown be compressed or that a part of the Crown be cut off. The three techniques used for the analysis were Diffuse Reflectance (using the abrasive rods supplied with the PE accessory), Reflectance Microscopy and Micro-ATR on the microscope.

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Figure 17.

The results for a substrate on such a Crown are shown in Figure 18. Spectrum A shows the diffuse result, Spectrum B shows the reflectance result and Spectrum C the micro-ATR measurement. In this example the product contains a carboxylic acid group and whereas both the diffuse and reflectance spectra show the carbonyl and hydroxyl grouping, the ATR measurement shows only very weak features for both.

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Figure 18. Results for Crown 3

Raman Spectroscopy
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One of the main advantages of Raman Spectroscopy is its ease of sample preparation. This would be an obvious benefit to the combinatorial chemist wanting data quickly from the beads or crown in a non-destructive manner such that he can easily move on to the next stage in the synthesis. The results shown in Figure 19 are the Raman spectra from two different crowns. The top spectrum is from the crown with the initial starting material on the surface whereas the lower spectrum shows the result after two reaction steps; the result of these reactions is that the new material contains a carbonyl group. Although the spectra are of very high quality and are very easy to obtain, they are totally dominated by the contribution from the polymer crown itself and show no bands to the reactions. Additional Raman data was obtained from other samples with the same result, namely that the intense Raman spectra from the polymer support is much stronger than that of the substrate of interest.

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Figure 19.

The relative usefulness of Raman compared to IR can be clearly illustrated by taking the above sample containing the carbonyl grouping and comparing it’s Raman with it’s IR spectrum (Figure 20). The top spectrum is the Raman data whereas the lower spectrum shows the IR data in absorbance units for ease of comparison. Although it could be argued that the Raman spectrum is a better spectrum, it is the IR one that shows the required carbonyl absorption.

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Figure 20.

[It should be noted that no attempt was made to find a system 'ideal' for Raman study. The aim was to compare the usefulness of several analytical techniques applied to the same type of sample].

Conclusions
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The relative ease with which FT-IR spectroscopy can determine the success or failure of a combinatorial synthesis appeals to the synthetic chemist. The fact that IR is a do-it-yourself technique means that the results are available immediately to the chemist. It would appear that the best techniques of analysis are diffuse reflectance using the aluminised pads, KBr discs, transmission through a crushed bead, or reflectance microscopy. For crowns, diffuse reflectance or reflectance microscopy would appear to be the best options.

Although ATR sampling techniques result in very good quality spectra, there is a real danger that the relevant absorption bands are too weak to detect easily. Raman spectra seem to suffer in the same way; the absorption bands of interest are very weak compared to the very intense bands due to the supporting polymer.

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5. AN FT-IR MICROSCOPIC
BASED IMAGING SYSTEM:
Development and Applications for Chemical Analysis

Norman A. Wright 

Bio-Rad,
Spectroscopy Division,
237 Putnam Avenue,
Cambridge, MA 02139
U.S.A.

Email: Norman_Wright@bio-rad.com

Keywords: imaging, spectroscopy, chemical analysis, mid-infrared

Introduction
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This paper provides an overview of an infrared spectroscopic imaging system along with some applications. The technique combines the emerging commercially available technology of focalplane array (FPA) detectors with a step-scan Fourier transform (FT) Michelson interferometer based spectrometer. This coupling provides an optimized method for infrared spectroscopic imaging by simultaneously realizing both a multiplex and multichannel advantage. Specifically, the multiple detector elements enable spectra from all pixels to be collected simultaneously, while the interferometer allows all the spectral frequencies to be measured concurrently. This technique can rapidly generate very high quality, chemically specific images from a wide variety of samples. Early systems were built for special purpose applications. Among these were airborne gas analysis [1,2] and astronomical observation [3]. The instrumentation described here is specifically oriented to chemical analysis.

Infrared microscopy is a tool that lends itself to the examination of heterogeneous samples. Using microscopy a researcher can more easily investigate a sample for defect analysis, domain identification or boundary information. Mapping techniques have been developed for infrared microscopes to expand the capabilities of and ease of use when studying this spatial nature of samples. However, creating a map becomes a time consuming task if both high spatial resolution and high signal to noise is required. Even with the current level of sophistication available in infrared mapping systems, this fundamental limitation cannot be overcome. A mapping system cannot generate, in a reasonable time frame, sufficient data to reconstruct an image with high spatial content as well as good signal-to-noise.

Infrared imaging is the logical replacement of infrared mapping when the need to spatially characterize a sample is required. With array detectors covering suitable spectral regions, this capability is now available. Samples can be viewed either in transmission or reflection and no staining or coating is required. The technique is non-destructive and works well for solids and liquids. The contrast that is seen in these images arises from the inherent infrared absorption of the sample, i.e.; every chemical compound has its own characteristic absorption pattern that creates an infrared signature.

This paper describes the instrumental components of the Bio-Rad FTS Stingray 6000 infrared imaging system configured for microanalysis (shown in Figure1), and a sampling of applications of this emerging powerful analytical tool.

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Figure 1.  The Bio-Rad FTS 6000 Spectrometer with an MCT Array Detector Mounted on a UMA500 Infrared Microscope

Experimental Set Up

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A review of focalplane array detectors and their potential for spectroscopic applications is discussed by Colarusso, et. al. [4]. While much of the current effort in developing focalplane technology is being carried out in the area of uncooled arrays, the LN2 cooled arrays are more sensitive and in general, better suited for spectroscopy.

The initial laboratory description of this technique (5) used a cooled InSb 128 x 128 pixel array detector. The detector has a spectral response window between 3 and 5 micrometers. This allowed collection of data in the narrow spectral region between 4000 and 2000 cm-1.

Because of the natural interest in mid-infrared spectral information, an MCT array detector was located for this application. The detector is a 64x64 pixel MCT array, with a spectral window of 2.3 to 11 microns (ca. 4000 - 900 cm-1), which was developed for the Javelin missile program for the U.S. Army. Repackaged, it represents commercial diversification of military technology.

Both the InSb and MCT FPA detectors provide digitized data output. The data is transferred to a host Windows NT based PC that also controls the FT-IR spectrometer. This simplification of the array detector control electronics has created a system rugged and reliable enough to be considered as a commercial product.

The spectrometer system described here is a Bio-Rad FTS 6000 Infrared spectrometer with a UMA 500 Infrared Microscope. The focalplane array detector is mounted on the microscope. The MCT array detector with its 64 x 64 element array views a sample size of approximately 7 mm x 7 mm per pixel or a 400 mm x 400 mm overall sample size using the standard Bio-Rad 15x microscope objective.

The FTS 6000 spectrometer is operated in step-scan mode for the imaging application. Although the integration time for the FPA is less than a millisecond, due to the time required for readout of the entire array, the use of the step scan mode is necessary. The data from the array detector is transferred directly to memory, via a digital frame grabber card that is installed in the single Windows NT based PC, used to control both the spectrometer and the array detector.

The fixed mirror position of the Michelson interferometer is piezo controlled. This allows the interferometer to maintain continuous alignment as well as establish and maintain discrete optical positions thereby allowing data collection from the focalplane array. The spectrometer has a range of step scans speeds, which allows the user to "sit" at a single optical retardation and co-add multiple frames to improve the signal-to-noise of the resulting spectra. The following diagram shows how the data acquisition is synchronized with the steps of the interferometer.

At each step of the interferometer, defined by the summed motion of the fixed and moving mirrors, the array detector is triggered to collect image frames, one or more per step. As shown below, multiple frames are collected and co-added at each step.

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Figure 2.  The diagram above shows the motion of the interferometer mirrors, moving and ‘fixed’ which result in step scan performance. At each step, frames of data are collected by the array detector and co-added to improve S/N.

The acquired data is an array of interferograms that following a Fourier transform generates a spectral hypercube. Additional processing includes library searches for unknown compositions and the ability to perform quantitative analysis after calibration or reference correction.

Using this technique we acquire a four dimensional array of data. We have a grid of points over the sample (two spatial dimensions) and at each point on that grid is an infrared spectrum (two additional dimensions -- infrared frequency and intensity). We can think of this ‘spectroscopic data hypercube’ in the following ways. First, the data can be thought of as a stack of images of the sample, each obtained at a different infrared frequency. Any card can be pulled out of the stack to ‘see’ what the sample looks like at one particular frequency. Second, an infrared spectrum exists for every point on the sample, and that spectrum can be used to identify a material, or for quantitation (how much is present).

This data is collected in a short time, just a few minutes, and is typically 16-64 MB in size. It can represent over 16,000 spectra, collected at typical analytical spectroscopic resolution, and the individual spectra can be from as small as a 5 mm square area. We obtain an infrared spectrum (a plot of infrared frequency versus energy absorbed) at each pixel, creating a total of 4096 spectra. All the spectra are collected at the same time. The data set can be thought of as a deck of cards. An individual card gives a picture of the sample at one particular infrared frequency (one ‘color’ of infrared radiation). If we drill down through the deck at one particular pixel location, we obtain the infrared spectrum of the sample at that position.

Examples
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Two simple examples of this imaging chemical analysis follow. The first example is of a nylon mesh sample. The image shown below is generated from the 3350 cm-1 band (NH stretch). The 3-dimensional image consists of 4096 resolution elements to create the infrared image. The red colour shows the area of highest absorption and the blue area represents no absorption, between the strands. This spectral region is shown selected in the spectrum shown on the right side of the figure. Because the sample consists of a single material, an image at any selected wavelength will result in essentially the same image.

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Figure 3. Image of a nylon mesh at 3350 cm-1. The mesh has a spacing of approximately 125 mm. The Spectrum on the right side shows the band from which the image is derived.

The second example of chemical specific imaging is of a three-layer laminate comprised of an epoxy and a urethane component. The differences between the two materials is shown in the following two figures. The laminate is first imaged using the 1414 cm-1 band. This band highlights the edge layers of the laminate. The last figure (Figure 5) shows an image at 1467 cm-1 which highlights the center layer of the laminate.

 

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Figure 4. The image on the left side is derived from the 1414 cm-1 band. The spectrum at the right shows that 1414 cm-1 band highlighted. The laminate has outside layers that contain a component with this spectral band.

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Figure 5. This figure shows the image created from the 1467 cm-1 band. This image shows that the center component of the laminate is made of material with a spectral band at 1467 cm-1.

Other Applications
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The areas in which infrared imaging has been applied and reported are varied, including biological systems, polymer systems, material defect analysis, agricultural products, and art restoration investigations.

Some specific applications and their references are, silicone leakage from artificial implants in breast tissue[6], primate brain tissue imaging [7,8], biomineralized tissue, distribution in bone sections [9], curing of polymer blends [10], diffusion rates in Liquid crystals [11], and discrimination of co-extruded polymers [12].

Summary
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Infrared imaging spectroscopic analysis is an emerging technique that provides chemical specific information as images. From these images, precise information about the chemical composition and material structure of a sample is obtained. This type of information is significant as it allows the investigator to understand more fully a chemically diverse sample, which is generally the rule rather than the exception when studying either made-made or naturally occurring materials. Due to the ease of infrared image generation, and the power of image analysis software tools, the ability to study complex systems is now readily available so that the analysis and applications become the focus rather than the experimental technique itself.

References
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  1. Michael R. Carter, Charles L. Bennett, David J. Fields and John Hernandez, Gaseous effluent monitoring and identification using an imaging Fourier transform spectrometer, in Substance Detection Systems, Proc. SPIE 2092 16-26 (1993).
  2. Charles L. Bennett, Michael R. Carter and David J. Fields, Hyperspectral Imaging in the Infrared Using LIFTIRS, in Infrared Technology XXI, Proc. SPIE 2552, 274-283 (1995).
  3. P. Cox, J. P. Maillard, P. J. Huggins, T. Forveille, D. A. Simmons, F. Riaut, R Bachiller, S. Guilloreau, A. Omont, Astron. Astrophys., 1996.
  4. Pina Colarusso, Linda H. Kidder, Ira W. Levin, James C. Fraser, John F. Arens and E. Neil Lewis, Infrared Spectroscopic Imaging: From Planetary to Cellular Systems, Appl. Spectrosc. 52, 106A-120A (1998).
  5. E. N. Lewis, P. J. Treado, R. C. Reeder, G. M. Story, A. E. Dowrey, C. Marcott, and I. W. Levin, "FTIR spectroscopic imaging using an infrared focal-plane array detector", Anal. Chem., 67, 3377 (1995).
  6. L. H. Kidder, V. F. Kalasinsky, J. L. Luke, I. W. Levin and E. N. Lewis, "Visualization of silicone gel in human breast tissue using new infrared imaging spectroscopy", Nature Medicine, 3(2), 235-237 (1997).
  7. E. N. Lewis, A. M. Gorbach, C. Marcott, and I. W. Levin, "High-Fidelity FTIR spectroscopic imaging of primate brain tissue", Appl. Spectrosc. 50, 263, (1996).
  8. E. Neil Lewis, Linda H. Kidder, Ira W. Levin, Victor F. Kalasinsky, Joseph P. Hanig and David S. Lester, Applications of Fourier Transfrom Infrared Imaging Microscopy in Neurotoxicity, in Imaging Brain Structure and Function, Annals of the New York Academy of Sciences, 820, 234-247 (1997).
  9. Curtis Marcott, Robert C. Reeder, Eleftherios P. Paschalis, Dimitris N. Tatakis, Adele L. Boskey and Richard Mendelsohn, Infrared Microspectroscopic Imaging of Biomineralized Tissues using a Mercury-Cadmium-Telluride Focal-Plane Array Detector, Cellular and Molecular Biology, 44, 109-115 (1998).
  10. Sung Joon Oh and Jack L. Koenig, Phase and Curing Behavior of Polybutadiene/ Diallyl Phthalate Blends Monitored by FT-IR Imaging Using Focal Plane Array Detection, Anal. Chem. 70, 1768-1772 (1998).
  11. C. M. Snively and J. L. Koenig, Application of Real Time Mid-Infrared FTIR Imaging to Polymeric Systems. 1. Diffusion of Liquid Crystals into Polymers, Macromolecules, 31, 3753-3755 (1998).
  12. John M.Chalmers, Neil J. Everall, Karen Hewitson, Michael A. Chesters, Martin Pearson, Andrew Grady and Barbara Ruzicka, Fourier transform infrared microscopy: some advances in techniques for characterisation and structure-property elucidations of industrial material, The Analyst, 123, 579-586 (1998).


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6. Applications of Raman microspectroscopy
in the field of semiconductors

T. Jawhari (a) and A. Pérez-Rodríguez (b)

(a)  Serveis Científico-Tècnics,
Universitat de Barcelona,
08028, Barcelona,
Spain
e-mail: jawhari@giga.sct.ub.es

(b) Dpt. d'Electrònica,
Universitat de Barcelona,
08028 Barcelona,
Spain
e-mail: perez-ro@el.ub.es

Introduction
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We all know the importance of microelectronics in our everyday life and the huge advances that occur continuously in small geometry devices and integrated circuits. This is, for example, well reflected by the astonishing fast changes that take place incessantly in the field of computers. The rapid evolution in semiconductor technology, including device fabrication, thin-film deposition, interface preparation and microelectronic processing, have increased the need for characterization techniques that can provide more precise information, especially on the structure of the materials. The quality of this information is one of the most critical factors in designing and manufacturing microelectronic devices since high performance integrated circuits and devices demand an excellent quality material, either in the form of bulk material, thin-film or device structure. Furthermore, in the last few years there has been a new interest in silicon (Si) technology, related to the development of Micro-Electro-Mechanical Systems (MEMS) in which sensor devices and micro-actuators are integrated together with the electronic circuits for signal processing and control. In such systems, the characterization of the electrical, optical, mechanical and thermal properties of the thin films and structures are also critical for the performance of the device. The study of both crystallographic and physical features of the structure is of high technological interest in order to improve the process steps in MEMS technologies.

Raman scattering is an extremely powerful contactless tool which allows non destructive and quantitative microanalysis of structural and electrical properties. This technique is very useful since the Raman signal is very sensitive to the microstructural state of the sample and other local environments giving therefore information on the structure of the material on the scale of a few lattice constants. Raman signal is a function of the electron-phonon interaction, i.e. lattice vibration, and is a good complementary method to other techniques used in the characterization of the solid state such as transmission electron microscopy (TEM), X-rays diffraction, X-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), Auger electron spectroscopy, etc. Most of these techniques require a sample preparation that often alters the material whereas, in principle, the Raman technique does not affect the sample at all which is a crucial point when characterizing processed devices. Another major advantage of Raman spectroscopy is that when combined to a microscope, the technique can probe smaller dimensional scale devices. This is important for the analysis of microstructures and devices, where the properties of the layers are strongly process dependent and may differ significantly from the bulk material properties. Therefore, the micro-Raman system is now one of the preferred methods when characterizing semiconducting materials.

We shall here illustrate the possibilities that offer micro-Raman spectroscopy in semiconducting materials with examples obtained in the Raman laboratory of the Serveis Científico-Tècnics in collaboration with the Department of Electronics of the University of Barcelona. These studies are mainly centred in the analysis of structures and processes in Si and group IV technologies (SiGe and Si based alloys, SiC...). In principle, Si constitutes the main material for electronic devices and integrated circuits. In this sense, the maturity reached in Si technology has allowed the development of high performance devices, which may include heterostructures with SiGex and, more recently, more complex SiGexCy and SiCy based alloys. This deep knowledge in the Si based technology has also been applied for a wide range of sensor and MEMS devices, constituting the basis of the Si micromachining technologies. Other group IV semiconductor, which now constitutes an emerging technology, is SiC due to its potential applications for high temperature, high power electronics and sensors working in harsh environments. This is related to the electronic and mechanical properties of this compound, such as wide energy band gap (2.4 to 3.2 eV, depending on the polytype), high thermal conductivity, mechanical strength, high breakdown electrical field (i.e., ability of the material to stand high electrical fields), and extreme chemical inertness even at high temperatures. The examples presented here are representative of the wide range of characterisation problems related to semiconductor based materials and structures which can be solved by the micro-Raman probe.

Instrumentation
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The great advances made in Raman microscopy since its discovery in the mid-seventies were fundamental in the applications of Raman spectroscopy to semiconductor devices since it provides a structural and molecular picture with a very high spatial resolution. The schematic diagram of the Raman instrument Jobin Yvon T64000 used at the University of Barcelona is shown in Figure 1. This spectrometer can work either in the micro-mode utilizing an optical microscope or in macro-mode with a conventional macro-chamber. For semiconducting materials, excitation source is usually provided by a typical Argon ion laser which emits discrete lines between 458 and 529 nm, with its two main lines at 488 nm and 514.5 nm. Sometimes other lines than the two main ones are used when analysis at different depth penetration is required. For these materials, changing the laser line from the green (514 nm) to the dark blue-violet at 458 nm will diminish the penetration depth. In the case of crystalline silicon, the penetration depth of the light in the back-scattering configuration has been estimated to be approximately 300, 600 and 800 nm for laser excitation at 458, 488 and 514 nm, respectively[1]. Higher penetration depth can be achieved by decreasing the excitation energy, as optical absorption decreases for energies in the visible-near infrared (NIR) region. For this, a titanium-sapphire laser can be coupled to the argon ion laser. This provides radiation in the NIR in a continuous way between 700 and 900 nm. The use of a NIR laser can sometimes be worthwhile, especially for Raman resonance measurements since many semiconductors have their electronic gap in the near infrared.

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Figure 1. Schematic diagram of the Raman spectrometer

This instrument comprises of a double monochromator and a spectrograph that disperses the Raman scattered light onto a CCD detector cooled with liquid nitrogen.

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Figure 2. Entrance optics of the micro-sampling system

As can be seen in Figure 2, the incident laser beam is reflected by a beam splitter and a flip mirror onto the microscope objective. This focuses light onto the sample. The scattered light is recollected by the same microscope objective (back-scattering configuration), passes through the beam splitter and is focused onto the entrance slit of the spectrometer. The flip mirror situated in the microscope also permits us to visualize the microscopic region under analysis with the TV camera. In the case of materials opaque to the laser, such as most semiconductors, the visualization of the sample in the camera must be achieved with a bright field reflection illumination system. The advantage of using a back-scattering set-up, as shown in Figure 2, is that the laser spot on the sample can be directly observed on the TV monitor which allows precise identification of the microscopic region of the sample analyzed.

When maximum lateral and axial resolution is required, a spatial filter, which consists of a pinhole, is placed behind the microscope at the image plane. This rejects scattered light originating from outside of the laser focal volume.

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Figure 3. Effect of laser power on the Raman spectrum of Si
(bandwidth vs power)

As already mentioned, micro-Raman spectroscopy allows analyses of many kinds of materials with no sample preparation. Solids are easily studied by placing them on a standard glass microscope slide. However, with a Raman instrument coupled to an optical microscope, it is sometimes necessary to take some precautions due to the high power density, typically between 104-105 W cm-2, as a result of tight focusing of the laser beam that is obtained with the microprobe. This may cause those samples with high optical absorption in the spectral region close to the laser frequency to be physically affected by local heating. Sometimes, a small black patch of the size of the focused laser spot appears due to local annealing. This local heating can also affect the shape and position of the Raman bands. For example, in Figure 3 we can see that the bandwidth of the Si Raman band at 520 cm-1 increases as the laser power augments. This phenomenon is not due to local degradation of the crystal, but only related to the local heating of the crystalline network which causes anharmonic effects in the spectra. Accordingly, this effect is totally reversible and is determined by the temperature gradient achieved in the scattering volume. For highly damaged or amorphous semiconductors, absorption of light increases and more intense thermal effects are observed. Other laser power effects such as wavenumber shift were sometimes observed. This is illustrated in Figure 4 which shows how the low frequency mode of CuS increases as the laser power is increased from 1.2 mW to 5.0 mW. This shift effect was also observed to be entirely reversible. These series of measurements were carried out in Cu-rich CuInS2 layers of a solar cell device, where CuS was found to appear as a secondary phase. All these results clearly imply the need to carefully test the possible presence of thermal effects in the spectra when using a micro-Raman probe. Typically, for a X100 microscope objective, the laser power at sample should be preferentially between 1 and 2 mW whereas with a X50 objective the laser power can be as high as
5 mW.

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Figure 4. Raman spectra of CuS recorded at different laser points:
(a) 1.2mW, (b) 2.5mW, (c) 5.0mW.

Spatial resolution
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An important point that has to be considered in microanalysis is the spatial resolution. Two different spatial resolutions can be separated in Raman microspectroscopy; namely, lateral and axial resolutions. Most of the manufacturers of micro-Raman instruments give a value for the lateral spatial resolution of 1 m m or even less which in fact corresponds to the theoretical diffraction-limited spot (1.22 lambda.gif (60 bytes)/N.A.). For instance, a typical x100 microscope objective used in the Raman microprobe experiment with a N.A. of 0.95 and lambda.gif (60 bytes) =488 nm would produce a theoretical spot diameter of 0.62 µ m. Therefore, submicron lateral resolution is achieved and thus allows the characterization of some specific and localized regions in single devices in an integrated circuit.

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Figure 5. Experimental configuration for the determination of lateral resolution in a PE-silver layer system

The lateral spatial resolution has been checked in the conditions of routine micro-Raman experiment by recording successive Raman spectra at different positions across a polyethylene (PE)-silver layer interface. The experiment was achieved by preparing a neat interface through vacuum-deposition of an extremely thin silver layer on a flat polyethylene surface and using a microscope xy translation stage controlled by a computer to probe the Raman signal across the interface (see Figure. 5). The intensity of the Raman band of polyethylene at 2884 cm-1 was measured for each spectrum recorded and plotted in function of the analyzed position as shown in Figure 6. The experiment was first carried out without any diaphragm and then repeated with a
400 µ m diameter pinhole situated at the back image plane of the microscope (i.e. the confocal arrangement), the microscope objective being a X100/0.95 N.A. From these data, it can be deduced that the lateral resolution for routine micro-Raman work is of the order of 2 µ m but can be improved to 1 µ m when using a 400 µ m pinhole in the confocal plane[2].

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Figure 6. Raman intensity of PE vs position across the PE-silver interface.

As already indicated, most semiconductors have a high optical absorption in the spectral range of the laser frequency. In this case, the axial resolution of the micro-Raman spectrometer is higher than the penetration depth of light, therefore the depth of the scattering volume is determined by the optical absorption. However, this is not the case for wide energy band gap semiconductors such as SiC or GaN. These semiconductors have a low optical absorption in the visible region, and are now receiving special interest in the field of high temperature applications and optoelectronic devices in the blue part of the spectrum. For these semiconductors, the minimum depth of the scattering volume of collected photons can be estimated from the theoretical nominal depth of field of the microscope objective, given by lambda.gif (60 bytes) /N.A.2, where lambda.gif (60 bytes) is the excitation wavelength and N.A. the numerical aperture of the objective. In reality, the axial resolution is of few microns and will depend very much on the diameter of the pinhole used in the confocal plane.

Applications
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First of all, we shall examine the different parameters that can be obtained from the Raman spectrum of solid state materials and analyze the type of information on their structure and physical properties they can offer.

a) Frequency
The frequency of the phonon Raman band depends on the interatomic forces (i.e. force constants of the bonds), the bond length, the masses and positions of the atoms and any effect affecting these features will produce a change in the frequency of the band. Hence, the band is sensitive to the presence of stresses or strains in the scattering volume: a tensile stress will determine an increase in the lattice spacing and, hence, a decrease in the wavenumber of the vibrational mode. In the case of compressive strain, the decrease of the lattice parameter yields a corresponding increase of the vibrational frequency. In the elastic regime, these shifts depend in a linear way on the magnitude of the stress, and the position of the Raman band can be used to measure the stress.

On the other hand, the presence of crystalline disorder also gives rise to changes in the frequency of the band, usually towards lower wavenumbers. These are related to the breaking of translational symmetry in the crystal, which can be produced by structural defects such as dislocations or by grain boundaries in nanocrystalline materials. The position and shape of the Raman band can be simulated with a correlation length model[3] which allows to estimate the value of the correlation length L from the analysis of the Raman band. This correlation length is defined as the characteristic size of crystalline domains in the scattering volume where the translational symmetry of the crystal holds, and is related to the average distance between defects for damaged crystals or to the grain size for nanocrystalline materials.

Other parameters affecting the frequency of the Raman band are the temperature which affects the contribution of anharmonic effects and the presence of chemical impurities in the crystalline network which leads to changes in the mass of the atoms in the lattice sites. For example, the presence of Ge atoms at substitutional positions in the Si network produces a decrease in the frequency of the vibrational modes, due to a higher mass. This is known as the chemical effect. Besides, the presence of impurities at substitutional positions also affects the lattice spacing due to the different size of the impurity. Hence, a stress effect will also occurs in addition of the chemical one.

b) Raman bandwidth
Raman bandwidth and bandshape are closely related to the crystalline order. In principle the bandwidth is related to the lifetime of the phonons. The presence of crystalline disorder produces a decrease of the phonon lifetime which thus generates an increase of the bandwidth. Therefore the density of defects can be evaluated from the bandwidth. On the other hand, the bandshape of the Raman line is also affected by confinement of phonons (for example in the case of polycrystalline structures where the phonons are confined in crystalline grains of average size L), being that given by the correlation length model. The fitting of both the bandshape and the frequency position of the Raman line with this model allows us to estimate both correlation length and average stress in the scattering volume. This is interesting for nanocrystalline materials where average grain size is given by the correlation length. The main limit for this measurement is that phonon confinement only occurs for sizes in the nanometric range (L<20nm for Si).

Nevertheless, we have also to bear in mind that all the features affecting the frequency of the Raman band can also give rise to a band broadening if gradients are present in the scattering volume, such as temperature gradients produced by the gaussian like profile of the incident beam in the light spot, or strain gradients in the layers.

c) Raman intensity
The intensity of the Raman band is also very sensitive to the structure of crystals and as a result significant information can be obtained from intensity measurements. Damage in the lattice leads to a decrease of the intensity of the first order modes, related to the breaking of bonds and changes in atomic forces displacements, and, hence produces a decrease of the Raman polarizability tensors. For example, ion bombardment during doping process will alter the original crystal with a consequent reduction of the Raman signal intensity. Intensity measurement is also performed for quantitative analysis of different polymorphisms, defects, disorder, micro-inhomogeneities, etc.

The strong dependence of the Raman experimental data (frequency, bandwidth and Intensity) on the structural features in the scattering volume calls for the extremely accurate measurement of the Raman line. For this, the experimental conditions should be as stable as possible. One of the main factors that affects the stability of the peak position is the temperature in the room where the spectrometer is installed. Variation in the lab temperature produces subtle mechanical changes in the diffraction gratings and optical parts. When high resolution measurements are required, the lab temperature stability should be better than ± 1oC. Moreover, the intensity of the Raman line can also be affected by possible dispersion of light by dust particles in the air, as well as on the measuring surface and mirrors. Some of these effects can be corrected (mainly the frequency shift) by measuring reference samples with well known bands, such as a single crystal reference Si wafer (520 cm-1). Another possibility is to use the plasma lines of the laser beam as internal calibration lines.

Examples of applications
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The first order Raman spectrum of crystalline Si has a well defined single line at about 520 cm-1. This line has a Lorentzian shape, with a full width at half maximum of approximately 3 cm-1. As already indicated, this line is extremely sensitive to the presence of stress. In a biaxial stress (i.e. stress components in the plane of the sample surface) in elastic regime, the stress Greek.jpg (773 bytes) can be obtained from:

Greek.jpg (773 bytes)= 250 . delta-c.gif (58 bytes)upsilon.gif (46 bytes) Mpa/cm-1

where delta-c.gif (58 bytes)upsilon.gif (46 bytes) is the frequency shift in wavenumber. Since the fabrication processes of semiconductors devices often produce strains in some localized region, the micro-Raman probe was found very useful in analyzing these small domains. For instance, this technique is now recognized as a powerful tool in identifying stress and strain in polycrystalline silicon structures used for the fabrication of large polysilicon micromechanical structures[4-6]. These micromechanical systems based on surface-micromachining technologies can have serious stress effects that can cause mechanical device failure, curling or fracture. Figure 7 shows the stress depth profile of a phosphorus implanted LPCVD (Low Pressure Chemical Vapour Deposition) polysilicon layer. The stress values obtained from the micro-Raman analysis were in good agreement with those based on mechanical deformation measurements[5].

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Figure 7.  Stress (s) depth profile in a phospherous implanted LPCVD polysilicon layer where d is the distance from the top surface.

On the other hand, the measurement of the intensity of the Raman band has been applied to quantify the residual damage in processed wafers, such as ion implanted ones. Figure 8 shows an example on the quantification of the implanted induced damage in wafers of 6H-SiC (an hexagonal polytype of SiC) implanted with different doses of Ge+ ions[7]. This is performed by the normalised intensity In=(Io-I)/Io, where I is the intensity of the Raman band measured in the implanted layer and Io is the intensity of the Raman band measured in a virgin non processed sample. For a low degree of damage, I is very similar to Io and In is close to 0. As damage increases, I decreases and In tends to the maximum value of 1. This gives a 100% of damage which corresponds to the damage level for which fully amorphization of the implanted layer occurs. In this case, all the crystalline modes vanish from the spectrum, and I becomes 0. Figure 8, which gives the intensity variation of the Longitudinal Optical (LO) peak of SiC at 967 cm-1, indicates how the crystalline structure is progressively destroyed as the implanted dose of Ge+ is increased. This method allows the degradation of the crystalline structure to be followed. It is also used to optimize the annealing process after ion implantation in order to eliminate the induced damage.

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Figure 8.  Relative intensity variation of the LO 6H-SiC peak in relation to that of the reference material versus the inplantation dose.

Furthermore, the changes in the bandshape and position of the Raman band related to phonon confinement allow the assessment of the average grain size and stress in nanocrystalline Si layers[8], as well as the density of defects in highly damaged Si films[9]. Figure 9 shows the spectra simulated for Si assuming spherical confinement and different values of the correlation length L. As can be seen, for values of L below 20 nm the Raman band is shifted towards lower frequencies and asymmetrically broadened, and both band shift and broadening increase as L decreases. However, in general the application of these models for grain size assessment has to take into account the fact that these are very simple models in which stress is assumed not to affect the shape of the Raman line and both stress and correlation length are assumed as uniform in the scattering volume.

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Figure 9.  First order Si Raman spectrum simulated assuming spherical confinement: (a) L = 60° Å, (b) L = 100° Å, (c) L = 200° Å

Raman spectroscopy can also be used as an interesting alternative method to X-ray diffraction for the characterization of heteroepitaxial layers. The Raman spectrum of SiGex alloys presents three main lines, related to Si-Si at about 500 cm-1, Si-Ge around 400 cm-1 and Ge-Ge about 300 cm-1 vibrational modes (see Figure.10). It was shown[10] that the wavenumber of these modes present a linear relationship with both chemical composition and strain:

upsilon.gif (46 bytes) Si-Si = 520 - 68x - 830omicron.gif (54 bytes)

upsilon.gif (46 bytes) Si-Ge = 500.5 + 14.2x - 575omicron.gif (54 bytes)

upsilon.gif (46 bytes) Ge-Ge = 282.5 + 16x - 384omicron.gif (54 bytes)

where upsilon.gif (46 bytes)  is the wavenumber of the Raman mode, x the chemical composition and omicron.gif (54 bytes) the strain parallel to the substrate. Using these relationships, a single Raman spectrum of SiGex allows the determination of silicon and germanium contents as well as strain. Similar relationships have also been proposed for SiCy as well as for more complex SiGexCy and SiGexBy ternary alloys[1,11].

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Figure 10. Raman spectra of SiGe0.3, showing the Si-Si, Ge-Ge and Si-Ge vibrational modes.
The Raman band at 520cm-1 is due to the crystalline Si substrate.

The high spatial resolution achieved with the Raman microprobe enables in depth study of complex multi-layered structures, such as Silicon-On-Insulator (SOI)[12-14]. SOI wafers are used for the fabrication of sub-micron Complementary Metal-Oxide-Semiconductor (CMOS) devices and integrated circuits for high frequency and/or high radiation level applications (such as for space electronics). A typical method used to carry out depth profiling in the multi-layer structure is to record measurements performed at different positions along the surface of the sample that has been previously bevelled at a low angle (Figure 11). Figure 12 shows the Si spectra measured at different positions from the SOI structure schematically represented in Figure 11. For this structure (which is not representative of the high quality state of the art material), structural degradation was observed in the region close to the Si/SiO2 interface, which is clearly observed from the changes of the Raman line. More recently, this method has also been successfully applied for the analysis of InAlAs/InGaAs/InP structures for high electron mobility transistor devices[15].

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Figure 11. Diagram showing several points along the bevelled Si-SiO2-Si structure where the micro-Raman spectra were recorded.

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Figure 12. Micro-Raman spectra recorded along the bevelled structure, where d is the distance from the top Si surface.

Mapping measurements can also be performed, providing a non destructive and simple way for the analysis of the thickness and structural uniformity of thin films, such as cobalt silicide films (CoSi2) deposited on Si for IR detectors[16] This was performed by measuring the intensity of the Raman signal from the Si substrate at different points on the surface. As can be seen in Figure 13, the intensity of the Raman line of the substrate decreases in an exponential way as the thickness of the layer increases. This is due to absorption of light in the layer. This method allows detection of CoSi2 films as thin as 3-4 nm, and the CoSi2 film thickness can be measured in the range between 10 and 100 nm with an uncertainty below 10%, provided that optical absorption in the film is known.

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Figure 13. Relative Raman intensity of the first order Si mode in function CoSi2 thickness, recorded on different polycrystalline films.

For amorphous materials, the lack of long-range order yields a breakdown of the momentum conservation rule, and all the phonons become Raman active. For amorphous Si, the spectrum presents four broad bands centred at about 150 cm-1, 310 cm-1, 380 cm-1 and 480 cm-1 (see Figure. 14). It has been shown that the width of the TO mode is a good measure of local order which provides a tool for the structural assessment of the amorphous layers. Further, the quantitative analysis of the band intensities related to the crystalline and amorphous phases gives the crystalline fraction in partially amorphous systems[8].

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Figure 14. Raman spectrum of amorphous silicon showing the different modes (LO: longitudinal optical, TO: transverse optical,
LA: longitudinal acoustic, TA: transverse acoustic).

High-resolution polarization measurements have also been performed on semiconductors layers in order to determine local crystallographic orientation[17-20]. Free electrical charge carriers (electrons, holes) concentrations in semiconductors have been measured[20-22] in local regions by the analysis of coupled LO-phonon-plasmon modes. These works established that the Raman microprobe is an interesting tool for determining the distribution of the carrier concentration and mobility in III-V compounds, such as GaAs, GaP, GaAlAs, etc., without carrying out electric measurements using electrodes. For highly doped p-type Si, the concentration of carriers can also be determined from the Fano-like deformation of the first order Raman line[11].

Furthermore, interesting information on local temperature in laser mirrors has allowed the optimization of device technology[23-25]. These were determined from the Stokes/anti-Stokes intensity ratio of Raman scattering. This method has also been applied to obtain in a non destructive way local temperature distribution in laser heated microstructures[26,27]. Raman microspectroscopy was also used to analyze semiconductor microstructure fabrication by direct laser writing[28,29], measure dopant activation profiles in GaAs doped with Zn by laser assisted diffusion[30], evaluate change of the crystal quality in molecular beam epitaxial GaAs layers on Si[31], and detect contaminants in integrated circuits[32,33]. Finally, the Raman microprobe has been utilized to get a complete picture of superlattice phonons since the method enables the identification of in-plane interface phonons from the study of their energy dispersion as a function of the in-plane momentum transfer[34,35].

More applications of Raman spectroscopy in the field of semiconductors can be found in references 36 & 37.

Conclusion
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We have seen that the capacity of the Raman microspectroscopy has been well exploited in the field of semiconducting materials. It can detect with no sample preparation microinhomogeneities in integrated circuits, defects in both optoelectronic, microelectronic and sensor devices, that are of special technological interest in connection with their possible influence on the device performance. The method also permits quantitative and nondestructive microanalysis of structures and electrical properties in semiconductors. These mainly include damage induced by ion implantation, strains in heterostructures, measurements of crystallographic orientations, polycrystalline grains size and free carriers concentration.

References
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  32. Y. Hiratsuka, Y. Hirano, and K. Tochigi, Mikrochimica acta, 3, 359 (1984).
  33. R.Z. Muggli, and M.E. Andersen, Solid State Tecnol., 28, 287 (1985).
  34. R. Schorer, W. Wegscheider, K. Eberl, E. Kasper, H. Kibbel, and G. Abstreiter, Thin Solid Films, 222, 269 (1992).
  35. G. Scamarcio, M. Haines, G. Abstreiter, E. Molinari, S. Baroni, A. Fischer, and K. Ploog, Phys. Rev. B Condens. Matter, 47, 1483 (1993).
  36. S. Nakashima, and M. Hangyo, IEEE J. Quantum Electron., 25, 965 (1989).
  37. T. Jawhari, "Applications of micro-Raman spectroscopy" in Handbook of Advanced Materials Testing, (N.P. Cheremisinoff ed.), Marcel Dekker, New York (1995).


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7. Raman Chemical Imaging of
Pharmaceutical Content Uniformity

Christopher T. Zugates and Patrick J. Treado

ChemIcon Inc.,
7301 Penn Avenue,
Pittsburgh,
PA 15208,
USA

Abstract
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Raman spectroscopy is an efficient means for probing molecular composition, and structure without being destructive to samples. Raman chemical imaging using liquid crystal tunable filter (LCTF) technology is a massively parallel approach that extends traditional Raman spectroscopy to provide information on sample morphology. As a result, Raman chemical imaging is an effective high throughput screening tool for the analysis of pharmaceutical tablet content uniformity. Analysis is performed without sample preparation and characterization of tablets in situ is feasible, even in manufacturing environments as a quality monitoring tool.

Introduction
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Rapid, high throughput assessment of the composition, structure and uniformity of active ingredient distribution in drug tablet formulations is of great interest to the pharmaceutical industry. Understanding these parameters is critical to tablet quality monitoring and control. Typical analytical strategies for performing tablet assays often involve invasive sample preparation procedures, including tablet crushing, dissolution and chromatographic separation of active ingredients from excipients. Where tablet content uniformity must be measured, invasive sample staining procedures are often required to generate image contrast between active ingredients and excipients. Active ingredient distribution can then be visualized using optical microscopy, for example. While traditional analytical strategies are effective, they are labor intensive due to the extensive sample preparation required and the techniques are applied to only a very limited number of tablets.

Infrared spectroscopy performed both in the mid IR [1] and near IR [2] provides the potential of rapid determination with little or no sample preparation. Raman spectroscopy also has demonstrated capability for pharmaceutical analysis.[3,4] Vibrational spectroscopic techniques are effective for compositional and structural characterization, as well as quantitation. However, bulk spectroscopy is ineffective for measuring the spatial distribution and architecture of actives which are heterogeneously distributed within intact tablets.

Recent advances in Raman liquid crystal tunable filter (LCTF) imaging spectrometers[5,6] combined with multivariate image processing techniques[7] make Raman chemical imaging a powerful technique for the analysis of wide variety of materials,[8] including pharmaceutical tablet architecture. Some of the materials studied to date include, corrosion systems, [5] polymer blends,[7,9] biological tissues,[10] actinide-contaminated ash samples,[11] surfactants, Martian meteorites [12] and semiconductors.[13] Chemical imaging combines Raman spectroscopy and digital imaging technology to make the assessment of tablet molecular composition and structure a routine analytical procedure. In Raman imaging using LCTFs, thousands of linearly independent, spatially-resolved spectra can be collected simultaneously to differentiate active ingredients even in the presence of complex host matrices. These spectra can then be processed to generate unique contrast intrinsic to analyte species without the use of stains, dyes, or contrast agents. As a result, there is little or no need for sample preparation to characterize heterogeneously distributed active ingredients.

LCTF Raman Imaging Instrumentation
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Raman imaging spectroscopy data was collected from a pharmaceutical tablet containing acetylsalicylic acid (aspirin) as an active ingredient using the FALCON Series 3500 Raman imaging microscope system developed by ChemIcon Inc. The FALCON supports a wide variety of laser excitation sources. In the Falcon system shown in Figure 1, a diode pumped Nd:YVO4 solid state laser source doubled to operate at 532 nm is coupled with a multimode fiber optic relay to an infinity-corrected optical microscope. Coupling is performed via an illuminator assembly that converts the infinity-corrected optical microscope to a Raman imaging platform. The illuminator defocuses the laser source and excites the entire sample field of view through a high numerical aperture (NA) microscope objective. The Raman scattering is collected with the same objective and is transmitted back through the illuminator which houses holographic notch rejection filters to remove the Rayleigh scattering. The Raman signal is filtered with a 9 cm-1 bandpass liquid crystal tunable filter (LCTF) constructed using the Evans Split-Element geometry. The LCTF is a compact electronically tunable filter that provides spectral resolution over the entire Raman spectrum comparable to a dispersive spectrometer without compromising the diffraction-limited imaging performance of the optical microscope. Raman images are collected using a thermo  electric (TE) cooled (-40 oC) slow-scan charge-coupled device (CCD) detector having 512 x 512 (20 mm square) pixels.

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Figure 1. FALCON Raman chemical imaging microscope

Multi-dimensional micro-Raman image data sets were collected under computer control of the LCTF and CCD detector using Acquisition Manager 4.0 software we have developed for commercial use. Multispectral Raman image data sets are processed in ChemIcon's SpecImage 4.0 software to remove contributions from background fluorescence and enhance molecular-specific contrast using univariate and multivariate analysis approaches. Raman spectra for individual pixels or average spectra for larger domains are visualized using ChemImage 4.0 and extracted for data presentation. More traditional morphometric-based image processing (particle counting, sizing and feature segmentation) is also performed using ChemImage 4.0.

Chemical Image Analysis
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We employ multivariate image analysis techniques that involve the application of chemometric techniques to spatially resolved spectra. Chemical (i.e. hyperspectral) imaging experiments produce vast amounts of data and are often subjected to data reduction techniques as an initial processing step. The intent of data reduction is to simplify the analysis by preserving the most important structures found within the data. Less important data structures including instrument response, sample background, and noise are ideally not considered during subsequent analyses.

Factor analysis, a first class of multivariate analysis techniques, is often performed to reduce the amount of data. For example, principal components analysis (PCA) is performed on the data to extract factors or scores that best represent the variation in the chemical image data. PCA reassembles the data as linear combinations of the original variables so that the largest variance in the data corresponds to the first principal component. Each subsequent principal component is orthonormal to the previous component and represents the largest remaining variance in the data. The maximum number of principal components allowed is equal to the number of variables measured and maintains the data structure but does not reduce the dimensionality of the data. Typically, the smallest set of principal components necessary to represent some large percentage of the total variance in the data is used for further analyses.[14]

A second class of multivariate analysis, cluster analysis, identifies differences between the spatially-resolved spectra and sorts them into categories based on differences in their measured variables. Each group of objects is treated mathematically as a single object that represents the variable mean of the cluster to a precision described by the variance or standard deviation within the cluster.[14]

Once the data has been preprocessed, the next task is to estimate the composition of the sample. Conventional algorithms, such as partial least squares, classical least squares, and multiple linear regressions, employ a variety of regressions that fit data populations to a predescribed set of observations made on samples of known composition. The data describing the measurements of the known samples are collectively referred to as a training set and are necessary for most multivariate analyses. In practice, a priori information about a specific sample may be unavailable or incomplete making conventional analysis requiring the use of training sets difficult or nearly impossible. In complex materials, training sets may not be adequate for describing all of the complex chemical interactions that arise in heterogeneous samples. Even when possible, constructing spectral image training sets is labour intensive.

Cosine correlation analysis (CCA) is a multivariate technique that assesses similarity in spectral data sets and image data sets.[7] CCA assesses chemical heterogeneity without the need for training sets. CCA identifies differences in spectral shape and efficiently provides chemical based image contrast that is independent of absolute intensity which makes it well suited to Raman chemical imaging.

To perform CCA, chemical image data is reorganized into an n x p matrix, D, where n is the number of pixels in each image frame and p is the number of frames. Since each frame is acquired at a different wavelength, p is also the number of wavelengths           (lambda.gif (60 bytes)1,lambda.gif (60 bytes) 2,...lambda.gif (60 bytes)p). Typically, it is necessary to remove bias from the data before analysis by adjusting each spectrum so that the minimum baseline intensity is zero to produce an offset-corrected matrix, D*. In CCA, a comparison is made between each spectral vector in the data set and a reference spectral vector. The correlation between two spectra can be thought of as the cosine of the angle (q ) between the vectors in p dimensional space. The tail of each vector resides at the origin and the heads have the coordinates expressed by the corresponding spectral vector. Because cosq remains unchanged if the lengths of D*Sample and D*Reference are altered, cosine correlation is scale invariant and is immune to non-uniform illumination of the sample and local changes in sample topography until the spectral signal to noise approaches 1. In practice, CCA, is performed pixel by pixel on chemical image data sets. In the resulting CCA image, the correlation score replaces the spectrum at each pixel reducing the dimensionality of the data from p+2 (p spectral dimensions and 2 spatial dimensions) to 1+2 dimensions.

Performing CCA using one reference vector does not insure image contrast between pixels representing different chemical compositions since many different spectra may be reduced to the same cosine score. For example, the collection of spectral vectors having identical cos q values can be conceptualized as lying along the periphery of the multidimensional cone ( a hypercone) having the reference vector for its axis of symmetry and its vertex at the origin. In order to remove all symmetry, p correlations need to be performed on the image data set using p different reference vectors. Even for large p values, most of the symmetry can be removed using only a few reference vectors. As in principal component analysis, it is often unnecessary to perform all possible correlations in order to achieve a high degree of chemical specificity. Ideally, the reference vector space should span the maximum variance of the data space so that most of the variance of the data is contained along the directions of the first few orthonormal reference vectors.

The choice of reference vectors can influence the efficiency of the data reduction. It is not necessary to know the number of pure components in the sample using this method. In fact, a histogram of the scores often reveals the number of spectral types and is useful in determining the number of components in a chemical system. If the number of components is already known, CCA can be used to determine if unknown species (i.e. foreign contaminants) might be present. Even for small numbers of correlations, all wavelength information about the sample is employed in generating the correlation score allowing unsuspected differences in spectral shape to produce image contrast. Chemical identity can be assigned by matching correlation scores from the image data set to correlation scores calculated for the spectra contained in a spectral library using the same CCA routine.

Results
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Figure 2 shows images of an over-the-counter pharmaceutical tablet containing aspirin as an active ingredient. While the pressed tablet appears homogenous in the macroscopic-scale image shown in Figure 2A, the tablet appears heterogeneous in the microscopic-scale reflectance image shown in the inset, Figure 2B. The heterogeneity visible in Figure 2B is not surprising given the rough surface topography of the pressed   tablet. However, it is challenging to correlate the microheterogeneity visible in Figure 2B with microheterogeneity of the active (acetylsalicylic acid) and excipient (calcium carbonate) materials because both species are white powders and cannot readily be differentiated within an intact tablet using conventional contrast enhancement strategies employed in optical microsopy, including color, differential interference contrast (DIC), nomarski and polarized light.

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Figure 2. Aspirin tablet. (A) Macro reflectance image (1mm).
(B) Micro-reflectance image (25µm).

Molecular compositional heterogeneity does exist within the sample at the microscopic level. Raman data shown in Figure 3 provides convincing evidence for the presence of compositional heterogeneity. Figure 3A is the brightfield reflectance image shown in Figure 2B. Raman microspectra are shown at random sampling points, 1-3. Figure 3D shows Raman microspectra captured through the LCTF at the sampling points 1-3. It is obvious from the Raman spectral band shapes that the local composition is varying. For example, the active ingredient, acetylsalicylic acid, has a band at 1044 cm-1 while the calcium carbonate excipient has a band centered at 1060 cm-1. The relative intensities of these two bands indicates the relative concentration of the materials which are clearly heterogeneously distributed at the spatial resolving power of the experiment.

While the randomly sampled Raman microspectra confirm heterogeneity, Raman imaging is required to visualize the distribution of the materials. Figure 3B shows the Raman band intensity collected by tuning the LCTF to 1044 cm-1 and Figure 3C is collected at 1060 cm-1. Note the similarity between the two. Due to the fluorescence background emitting from the tablet, image contrast is dominated by the surface topography of the sample.

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Figure 3. Aspirin tablet. (A) Micro-reflectance image.
(B) Raw active Raman image at 1044cm-1.
(C) Raw excipient Raman image at 1060cm-1.
(D) LCTF Raman microspectra

Scale : 25µm

Susceptibility to surface roughness is a general limitation of Raman imaging based on scattered intensity. However, this problem can be avoided by making use of the Raman spectrum at each linearly independent pixel to generate images based on other spectral band parameters, including subtle differences in spectral shapes. A very effective strategy that compensates for varying sample topography is cosine correlation analysis (CCA), as shown in Figure 4. Figure 4A is a 1044 cm-1 correlation image revealing active ingredient distribution, including the presence of two particles between 20-40 µm in diameter. Figure 4B is a 1060 cm-1 correlation image revealing excipient, which are more uniformly distributed than the actives. Note that CCA is spectral shape dependent, but insensitive to local concerted variations in spectral intensity due to surface topography. As a result, the CCA images shown in Figure 4 differ substantially from the Raman intensity images of Figure 3. Figure 3 and Figure 4 both show microstructure from a small region of the tablet surface. While Figure 3 is showing surface topography, Figure 4 is showing surface chemical composition.

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Figure 4.  (A) CCA active Raman image at 1044cm-1.
(B) CCA excipient Raman image at 1060cm-1.
Scale: 25µm

The two active ingredient particles are visualized in Figure 5A, a chemical surface map derived from the two-dimensional image of Figure 4A. However, the compositional texture of the tablet becomes more obvious when seen as a surface map. Figure 5B shows the chemical surface map for excipient distribution. As anticipated, where the active ingredient is localized, the excipient is absent.

It is striking that the 1044 cm-1 and 1060 cm-1 spectral features can be used to generate molecular chemical image contrast, as the band centers vary by only 16 cm-1. The images shown in Figures 4 and 5 would be very challenging to obtain using alternative imaging spectrometer technologies. The spectral resolving power of the LCTF is very high due to the narrow spectral bandpass (<9 cm-1) and fine tunability, especially when combined with the excellent sampling statistics available in a typical imaging experiment. For example, it has been demonstrated that the LCTF has a resolving power of greater than 0.03 cm-1 in the study of semiconductors.[15] With regard to other sampling characteristics, LCTF Raman microscopy provides diffraction-limited spatial resolution of 250nm with appropriate high numerical aperture microscope objectives. To capture the raw image data of Figure 3, an integration time of 5 sec/spectral band was employed. Typically, integration times range between 1-30 secs/spectral band and depend on the scattering cross-section of the analyte of interest, its relative concentration and background emission (fluorescence) levels. Typical sample areas that are analyzed from square mm down to square mu.gif (60 bytes)m.

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Figure 5.  (A) Active Raman chemical surface map.
(B) Excipient Raman chemical surface map.

Conclusions
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The recent advancement in LCTF Raman imaging technology is changing the way Raman spectroscopy is being employed for materials characterization, including pharmaceutical tablet analysis. A driving force for change is the desire to understand how sample morphology, composition and structure influence the physical and chemical properties of complex materials. LCTF Raman chemical imaging is gaining wide acceptance by providing users unprecedented capability for molecular characterization of materials, even materials that traditionally have been difficult to assess. LCTFs coupled to CCD detectors facilitate wide field Raman image collection and allow experiments requiring excellent image fidelity to be performed in less time than conventional scanning techniques. By harnessing multivariate image processing, it is becoming possible to analyze materials without sample preparation even in manufacturing environments.

Raman chemical imaging is not limited to microscopic analysis and can be performed on large samples as well. Macroscopic Raman imaging requires lasers to have sufficient power to maintain high power densities across large sample areas. For sample areas of a few square inches, it is possible to attain sufficient laser power with commercially available lasers. Wide field Raman chemical imaging of larger samples requires greater laser power and becomes impractical until mainframe solid state lasers providing higher powers (>10W) become commercially available. However, new generations of diode laser technologies are continually being developed which will facilitate LCTF Raman chemical imaging becoming a universal imaging technique.

References
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  1. J. A. Ryan, S. V. Compton, M. A. Brooks and D. A. C. Compton, J. Pharm. Biomed. Anal. 9, 303 (1991).
  2. J. D. Kirsch and J. K. Drennen, Appl. Spectrosc. Rev. 30, 139 (1995).
  3. C. J. Petty, D. E. Bugay, W. P. Findlay and C. Rodriquez, Spectroscopy 11, 41 (1996).
  4. T. M. Niemczyk, M. Delgado-Lopez, and F. S. Allen, Appl. Spectrosc. 52, 513 (1998).
  5. Morris, H. R.; Hoyt, C. C.; Miller, P.; Treado, P. J. Appl. Spectrosc. 50, 805 (1996).
  6. Turner, J. F., II; Treado, P. J. Proc. SPIE – Int. Soc. Opt. Eng. 3061, 280 (1997).
  7. Morris, H. R.; J. F. Turner, Munro, B.; Ryntz, R.; Treado, P. J. Langmuir 15, (1999) in press.
  8. M. D. Schaeberle, H. R. Morris, J. F. Turner II, and P. J. Treado, Anal. Chem. 71, (1999) in press.
  9. H. R. Morris, B. Munro, R. Ryntz, P. J. Treado, Langmuir 14, 2426 (1998).
  10. N. J. Kline and P. J. Treado, J. Raman Spectrosc. 1997, 28, 119-124.
  11. G. J. Havrilla, J. Schoonover, F. Weesner, M. C. Sparrow, P. J. Treado, Appl. Spec. 1998, 52, in press.
  12. Treiman A. H. and Treado P. J., Lunar Planet. Sci. XXIX, 523 (1998).
  13. Schaeberle, M. D. Treado, P. J. Proc. XVth ICORS, S. A. Asher, Ed., (Wiley, Chichester, 1996) 1188.
  14. P. Geladi, and H. Grahn, Multivariate Image Analysis, John Wiley and Sons, Inc., New York, NY, 1996.
  15. M. D. Schaeberle, Raman Chemical Imaging: Development and Applications (Doctoral Dissertation, University of Pittsburgh), 1998.


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8. IMPORTANT NOTE
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Back in early October, Perkin Elmer invited me to attend the Marketing Launch of a new FTIR - their Spectrum One instrument. I donned my 'press' badge and brandishing notebook and pencil, noted down everything I could find. I have produced the article to follow - it is my personal view of the instrument. - Remember it is not a description authorized by the company. I asked the company's scientists for details where my notes were inadequate and once written, I asked P-E to check the manuscript for glaring errors, but I DID NOT invite them to edit the paper.

I have also started work on a technical article on Spectrum One for you. Since the company allowed me access to "everything", its preparation is a bit of a mammoth task, so don't expect the see the second part for a few editions yet.

Patrick Hendra
Editor

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Perkin Elmer's New Instrument
- Spectrum One



Your Editor’s Totally Prejudiced description
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Immediate reaction – small,  neat and looks smart. Totally computer controlled with no equivalent of the built-in control panel found on the PE1600 and Paragons and the machine comes with several accessory pods. The Nicolet Avator but coloured P-E grey, I hear you ask? No I don’t think it is. I think it’s significantly different. The specification looks excellent and quite clearly the machine would be useful in a research laboratory.

Next reaction – has several clever features. Not features aimed at me – an old spectroscopist, but rather at the young chemist or materials student  and occasional user or the QC analyst. One feature I really like is a touch screen set up to make spectroscopy absolutely idiot proof.

But then let me tell you about it
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Basic Layout
Spectrum One is set out in the now contemporary way – a very small footprint on the bench with a full-size sample area symmetrically situated in the front. It’s about a foot high (300mm) and has a depth and width of around 2 ft sq., so it’s area even allowing for the cables at the back is considerably less than a square metre. It weighs around 30kg (60lbs), not light but unlikely to bend the bench top. A computer controls the instrument, but this doesn’t have to be adjacent to the optical bench. The computer can be in a separate room or even miles away.

The sample area (and let’s face it, this is the bit the user actually wants to know about) in it’s transmission form, has a horizontal plate onto which is mounted the industry standard 2" x 3" slideway stand and the whole lot is closed by a detachable lid.

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Figure 1. The Spectrum One system

(left to right: diffuse reflection accessory, Horizontal ATR,   universal ATR, the optical bench fitted with the transmission accessory pod and of course, the computer.)

To the right of the sample area, you will see a rectangular panel. In strip-down trim this acts as a simple status indicator with diodes to tell you that the source and laser are working and whether the interferometer is scanning or not.

In it’s higher specification, Spectrum One has a clever touch sensitive liquid crystal display in this position. The touch screen enables occasional and non-expert users to use a custom-made procedure especially prepared for them and to do so with minimal skill.

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Figure 2. The Spectrum One Built-in touch screen - two examples

In Figure 2, you will see the touch screen set up to carry out a horizontal ATR based routine. Once called up, the screen requires the user to insert the appropriate accessory. Pressing the touch screen takes the user through all the essential steps - checking the accessory, insertion of the sample, optimization of the system, recording the spectrum and its presentation in an agreed format on the computer screen, and if required on paper through a printer. This feature seems to me to be ideal for use in teaching, in service laboratories and of course, in routine analysis. In the past, instrument makers have tended to produce instruments that require the user to understand how the system and accessories work. However, highly expert chemists or pharmacists, materials scientists or skilled analysts want to use the instruments and interpret the results. Their cross-section of skills do not include experimental spectroscopy so the approach adopted in Spectrum One is timely and highly appropriate.

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Figure 3. Spectrum One fitted with it's universal ATR after a spectrum has been recorded. A small spectrum can be seen on the touch screen.

I have already said above that the computer can be remote – it can be – it can be networked to control several instruments, but if it is, you need a keyboard at the machine to key in the sample identification. I was even more intrigued to discover that for QC and similar measurements, you don’t even need a keyboard – you can use a bar code reader to identify the sample!

When the spectrum is running, a very attractive icon – a tiny spectrum wriggles before your very eyes at the bottom of the screen. See Figure 2. When the spectrum is acquired it appears in miniature form on the touch screen, see Figures 2 & 3. In many installations a whole gang of users will want to use the machine each with a different set of requirements. This too can be accommodated through a password system.

In the end, people buy on performance. I saw some impressive results on stability and signal:noise ratio (essentially the quality of the spectrum) significant if you are looking at weak bands. The performance is better by more that two in both respects than the P-E Paragon, the machine that Spectrum 1 replaces. Range 7800-350cm-1 but extension to 200cm-1 is promised very shortly and I suspect nir will follow soon. Resolution - ½cm-1, so its more than adequate unless you are seriously interested in gases. Almost all FTIRs have the source and interferometer sealed inside a desiccated base but the manufacturers usually leave the detector area open to the atmosphere. Spectrum One encloses everything other than the sample area. Must be a good idea.

Accessories
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Three accessory 'pods' are on offer at launch. You remove the sample area lid, slide out the standard absorption base and then slide in the accessory of your choice (limited only by your chequebook). As you do, a small processor on the accessory identifies it in detail (down to its traceability for QC work) and sets up alignment motors built into the pod. Fit the top plate (in the case of ATR) of your choice and another processor defines this. The machine then automatically optimizes so the accessory alignment is ready for you to proceed. In the diffuse reflection accessory, this automatic alignment routine is repeated when the sample or reference are introduced.

Horizontal ATR
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Figure 4. The Spectrum One Horizontal ATR accessory.

The ATR crystal (ZnSe or Ge) is pretty standard in size and can be illuminated at 30, 45 or 60º. To achieve this you need a set of top plates one for each combination of crystal and angle. The top plate is instantly interchargeable and as I have explained, each plate contains a processor, which tells the machine the crystal material and the angle. Troughed and flat plates are, of course, available. Needless to say, you can press the sample on the crystal if it’s a flexible solid. Another processor lower down in the pod controls the alignment routine so the user has to do little or nothing other than putting the sample on the crystal.

Many users may not be aware that changing the angle of the horizontal ATR can be beneficial. By changing the angle the number of reflections can be altered and hence the sensitivity of the technique adjusted. An example is shown in Figure 5.

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Figure 5. The effect of crystal angle in horizontal ATR.
The sample is toluene

Universal ATR
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P-E’s euphamism for diamond ATR – your learned Editor’s favourite technique! Again, its in the form of a plug-in pod and comes with several diamonds allowing 1, 3 or 9 reflections. As with the horizontal ATR, the processor in the top plate sets up the instrument and the second processor in the lower section sorts out the alignment.

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Figure 6. The Spectrum One Universal ATR accessory.
The stainless steel knob is twisted to apply downward
pressure on the sample placed on the horizontal top plate.

In diamond ATR (a bad description because you can use a Geranium [Sorry Germanium –  I couldn’t resist that one! -Assistant Editor]  prism for some purposes and P-E will oblige. You must press the sample really firmly into the crystal and the force is important. It is essential you apply enough but not too much. In all the existing diamond ATRs available from accessory manufacturers, a torque wrench is normally provided. You wind the pressure screw to a recommended set torque. I love torque wrenches but then I’m a freaky DIY auto mechanic(!), but many people find the procedure clumsy. On the Spectrum One, P-E supplies a force SENSOR. Twiddle the knob to press down on the sample and a green bar grows from left to right on the computer screen, so you know exactly what you are doing. Overdo it and the bar changes to red and flashes angrily at you to tell you to ease off. Have a look at Figure 7. A similar force sensor is fitted to the horizontal ATR.

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Figure 7. A diamond ATR spectrum and the Force Gauge readout.
The green bar from left to right shows the pressure is applied.

Diffuse Reflection DRIFTS
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Figure 8. The Spectrum One fitted with the diffuse reflection accessory.
The black vertical rectangle is the sample holder.

DRIFTS is a good technique. Mix a solid with dry KBr at around 5%, put it in a stainless steel cup and reflect mid i.r. off it. Alternatively, rub a small abrasive pad over a specimen and look at the reflection spectrum of the 'loaded' pad. The problem with the technique has always been "skill". You have always had to align the sample in the accessory – get the focus right (focus the incident radiation accurately onto the sample surface) and get the alignment ‘spot on’ so that the reflected light is efficiently collected. All very fiddly! The P-E Spectrum One DRIFTS accessory is fully motorised – when you shove the accessory into the spectrometer, the mirrors adjust the set up to produce a maximum in intensity. So, how do you load the sample? Well, you either fill a cup with KBr/sample mixture and scrape off a nice flat surface OR you rub the sample on the disposable aluminised abrasive pads OR you rub the provided disposable "sticks" on an immovable sample. You then drop the sample into a sample slide rather like a microscope accessory slide, push it into the first position and run the background. Push the holder the whole way in and run the sample. As the reference or sample is shoved into the accessory, the machine re-aligns to maximise the quality of the spectrum. (Even I, after a bottle of Australian Chardonnay couldn’t get it wrong!)

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Figure 9. The Spectrum One DRIFTS Accessory

Software
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Two bits of software took my eye, but there was an enormous amount to consider. When you run a spectrum on any F-T instrument the spectrum you actually record has a distorted band-shape and band position. The same problem applied in the dispersive days but no one noticed because the spectra were so bad. The problem is that the band-shape and position vary unpredictably from experiment to experiment. This difficulty is fairly subtle and most people don’t notice it, but it does spoil accurate quantitation measurement.

Absolute Virtual Instrument (AVI)
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The P-E team has devised an Absolute Virtual Instrument (I know a Virtual Instrument is all you can afford!) The optical bench incorporates a tiny cell containing methane. When instructed, it runs the methane spectrum at whatever resolution you happen to have selected. The machine then generates within memory a spectrum it SHOULD have produced based on the high-resolution data available in the literature. It then compares its real spectrum with the theoretical one and generates a correction algorithm – very clever! Does AVI work? Superbly! If a sample is recorded by several methods, it is inevitable that the perturbation caused by the DRIFTS accessory is not identical to that caused by the ATR pod etc. [AVI does not allow for effects arising from the reflection process itself]. Or, spectra recorded on one instrument from those on another or your instrument has been serviced and hence spectra recorded before and after the service visit are not identical. The errors are not too bad but they are significant in quantitative analysis. Apply the Virtual instrument process and hey presto the spectra all look the same. Look at the example in Figures 10a and 10b.

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Figures 10a and 10b. In the left hand diagrams you see bands in the gaseous HCl spectrum recorded at 4cm-1 (Figure 10a) and 1cm-1 resolutions (Figure 10b) on different instruments. In the right hand pair of diagrams you see the effect of AVI. Instrument: Instrument differences are effectively removed.

Atmospheric Absorption Suppression
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When you run an infrared on a single beam instrument (and all FTIRs are such) you record a background, then a spectrum and the computer then point by point divides one by the other, the spectrum displayed in transmission (0-100%) being a plot of
( I sample/I reference) vs v. Theoretically atmospheric CO2 and water vapour should give no bands because they appear equally in both the sample and reference. In reality, the CO2:H2O ratio is always changing and the H2O level varies continuously and hence real spectra often contain positive or negative CO2 bands and also weak water bands.

These spurious features really are a nuisance particularly if you are looking for weak VC=O or VOH bands. As part of the Spectrum One package you can have a software set to automatically remove these bands. It works really well and is fully automatic.

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Figure 11. Atmospheric Compensation

IR Expert
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This package appealed to me. In essence it looks at the spectrum you have recorded, tells you how well you have done and then applies corrections to get the best out of your data. In Figure 12, you see a spectrum with a high noise level and a quality Report. Note the yellow and red lights at the top. This spectrum didn't earn a green light. The copy tells you what is wrong. If you then issue the appropriate instruction, the computer will tidy up your handywork. See Figure 13.

To carry out the corrections only a single click is needed - the processes are fully automated. As well as identifying the problems and correting them the folks at P-E offer advice on how to do better next time - ideal for students and occasional users.
The advice is intoned by a lady with a Scottish accent. At the launch meeting an American marketing man asked - "Why Scottish?",   "because no-one hates the Scots" was the reply! After all, they never embarass anyone by getting to the Final group in the World Cup!

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Figure 12. Checking spectrum quality

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Figure 13.Tuning up poor spectra.
On the left the background is flattened - on the right noise is suppressed

Price
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Impossible to give one because as is normal in the instrument industry, the options are huge and the price reflects what you decide to have and how good you are at haggling with the salesman. Put in CD parlence, the Spectrum One is a mid-priced option. It’s certainly not budget price or full price.

Summary

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Now the crunch - I accept you would like me to tell you whether to buy Spectrum One. This is beyond the Journal's remit because we have nothing to compare it with. This report is NOT a road test - it's a description.

I am prepared to tell you what I liked.

I thought it would be ideal in my research lab because we don't do high resolution spectroscopy on gases. The S:N ratio is superb and it's dead stable, so the machine is ideal for working on weak bands. I think Spectrum One is just what is wanted for teaching and service labs - the touch pad and the totally sealed and dessicated optics are attractive. Being able to set up a routine for a particular problem is ideal especially because I don't have to teach the student or synthetic chemist how to drive the computer.

QC and routine analytical applications - Validation standards can be built in. Search and Quantitative packages are all on offer and the stability must be a very important consideration in this field.

So, there it is - my immediate impression.



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9. A Letter to Santa.....

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